1999
DOI: 10.1103/physrevb.60.8791
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Current injection from a metal to a disordered hopping system. III. Comparison between experiment and Monte Carlo simulation

Abstract: We have performed electric-field and temperature-dependent electron injection studies in an aluminum/ tris͑8-hydroxy-quinolinolato͒aluminum/magnesium:silver single-layer organic light-emitting diode. Analysis of the observed injection currents in terms of the classic Fowler-Nordheim ͑FN͒ tunneling or RichardsonSchottky ͑RS͒ thermionic emission proved to be inadequate. Whereas, the FN-type behavior at high-electric fields must be considered accidental, the injection currents qualitatively resemble those of the … Show more

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Cited by 108 publications
(77 citation statements)
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References 25 publications
(29 reference statements)
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“…Temperature, disorder, applied field, and interface dipoles influence the transport of carriers across a MO interface [32][33][34][35][36][37]. Other variables are sample preparation technique, and time [38].…”
Section: Discussionmentioning
confidence: 99%
“…Temperature, disorder, applied field, and interface dipoles influence the transport of carriers across a MO interface [32][33][34][35][36][37]. Other variables are sample preparation technique, and time [38].…”
Section: Discussionmentioning
confidence: 99%
“…8) assumes that an electron from the contact can be injected into the dielectric once it has acquired sufficient thermal energy to cross the potential maximum resulting from the superposition of the external and the image-charge potential. [186,207] However, if the SAM has structural imperfections (such as defects or impurity ions), these defect states can act as electron traps. Thermally excited trapped electrons will contribute to the current density according to Poole-Frenkel emission (Eq.…”
Section: Thermally Activated Processesmentioning
confidence: 99%
“…McCreery [144] associated hopping with nuclear motion (or molecular reorganization), and Bässler and co-workers [186][187][188] proposed that hopping occurs among large defects or impurities. Whatever the origin of the hopping, it is observed much less frequently in SAMs than is tunneling because the typical lengths of the molecules investigated are seldom greater than $2 nm.…”
Section: Thermally Activated Processesmentioning
confidence: 99%
“…The J-V characteristic of device B at negative voltage in Fig. 3(c) showed quite good straight line in plot of ln J vs V 1/2 at À0.3-À1.0 V. This straight line relation indicates that the conduction mechanism is Richardson-Schottky (RS) thermionic emission, 26 which is a kind of injection limited current. On the other hand, the J-V curve of device C at À0.01-À1.0 V in Fig.…”
Section: -mentioning
confidence: 87%