2007
DOI: 10.12693/aphyspola.112.221
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Current Fluctuations in Single Barrier Vertical GaAs/AlAs/GaAs Tunneling Devices

Abstract: We report the experimental results of the low temperature (T = 4.2 K) low-frequency current fluctuations measurements in the single-barrier resonant tunneling GaAs/AlAs/GaAs device with Si δ-doping in the center of the 10 nm thick AlAs barrier. The dimensions of the device were 200 µm by 200 µm. For the biasing voltages 0.1 V < |U | < 1 V we observed the Fano factors between F = 0.7 and F = 0.95. We explain it by the existence of the trapping centers/imperfections/resonant levels inside the barrier participati… Show more

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Cited by 3 publications
(3 citation statements)
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“…However, at biases higher than 0.6 V, the generation-recombination noise appears in the low frequency part of the spectrum, which indicates that some electron traps (e.g. donor states) are active in the tunneling process [6,7]. More quantitative results come from the analysis proposed in [9] (subtracting the shot noise value and then dividing by a square of current for a given bias), which visualize the relative modulation noise spectral density.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…However, at biases higher than 0.6 V, the generation-recombination noise appears in the low frequency part of the spectrum, which indicates that some electron traps (e.g. donor states) are active in the tunneling process [6,7]. More quantitative results come from the analysis proposed in [9] (subtracting the shot noise value and then dividing by a square of current for a given bias), which visualize the relative modulation noise spectral density.…”
Section: Resultsmentioning
confidence: 99%
“…Circular junctions with diameters of 125, 250 and 500 µm were prepared by optical lithography. Two kinds of transport measurements were performed: (1) current-voltage characteristics, where a DC bias was applied between the top contact and bottom electrode and tunneling current was measured, and (2) current noise spectral density, where the fluctuations of tunneling current for a fixed bias were measured by means of cross-correlation technique [6,7]. All the measurements were made at 4 K.…”
Section: Samples and Measurement Techniquementioning
confidence: 99%
“…The current noise has been measured by means of cross-correlation method with two independent transimpedance home-made amplifiers with gain 10 7 and 10 8 V/A [3,4]. Analysis of the current data has been performed in Matlab • R .…”
Section: Samples and Measurement Techniquementioning
confidence: 99%