“…where C is a fitting parameter, R Ω0 is the Ohmic resistance, and k is the Boltzmann constant. As shown by Al Turkestani [30], at low temperature the exponential term is much greater than the first two terms Hence, for this experiment, the third term is deemed sufficient and the expression is simplified to: Similar to SEM analysis, XRD patterns ( figure 3) show no significant differences between the samples, with all three patterns showing prominent peaks at 28.2°, 31.2°, 32.2°and 45.6°that are characteristic of the (211), (221), (301) and (002) planes respectively (using the Pbnm space-group labelling convention [11]). These planes are representative of nanoribbons lying at 37°, 44°, 46°and 0°from normal to the substrate for the (211), (221), (301) and (002) planes respectively.…”