1988
DOI: 10.1103/physrevb.37.1525
|View full text |Cite
|
Sign up to set email alerts
|

Current distributions of thermal switching in extremely underdamped Josephson junctions

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
2
1
1
1

Citation Types

1
45
0

Year Published

1989
1989
2016
2016

Publication Types

Select...
4
4

Relationship

0
8

Authors

Journals

citations
Cited by 59 publications
(48 citation statements)
references
References 34 publications
1
45
0
Order By: Relevance
“…These tests have been performed with the junction biased in the resistive state but otherwise with experimental conditions identical to those used for performing switching current measurements. We note that the instrumental resolution of the switching current measurements by a timing technique as implemented in this setup is extremely high as in comparison to other approaches using analog to digital converters 10,12,31 or time to amplitude converters 24,25 . However, we note that typically the experimental resolution for switching current measurements is not limited by the instrumental resolution of the data acquisition hardware but rather by the residual current and voltage noise in the junction bias electronics.…”
Section: Experimental Resolutionmentioning
confidence: 95%
See 2 more Smart Citations
“…These tests have been performed with the junction biased in the resistive state but otherwise with experimental conditions identical to those used for performing switching current measurements. We note that the instrumental resolution of the switching current measurements by a timing technique as implemented in this setup is extremely high as in comparison to other approaches using analog to digital converters 10,12,31 or time to amplitude converters 24,25 . However, we note that typically the experimental resolution for switching current measurements is not limited by the instrumental resolution of the data acquisition hardware but rather by the residual current and voltage noise in the junction bias electronics.…”
Section: Experimental Resolutionmentioning
confidence: 95%
“…Similar time-based methods for measuring the junctions critical current at a constant current ramp rate 24,25 or the lifetime of the zero-voltage state of a junction at a constant applied bias current 17,35 have been implemented by other groups.…”
Section: Digital Control and Data Acquisition Electronicsmentioning
confidence: 99%
See 1 more Smart Citation
“…Since this underdamped classical regime has already been realized experimentally, we believe that realizing our scheme using such setup is possible [40][41][42][43]. Finally, we note that our control scheme is not restricted to two lattice systems, but could be applied also to other Hamiltonian systems having mixed phase spaces and offering chaotic layers which can be systematically connected and disconnected.…”
Section: Experimental Realizationsmentioning
confidence: 99%
“…The lifetime of the metastable state depends on the resistance R in the low damping regime. In a recent experimental work concerning supercurrent decay in Josephson junctions, Silvestrini et al 8,9 consider the effect of dissipation in an underdamped junction. They have established an exponential temperature dependence for R. In the present work, we concentrate on the voltage dependence of R and show that metastable states arise mainly due to the nonlinear nature of resistance and can occur even in the absence of noise.…”
Section: S19mentioning
confidence: 99%