2012
DOI: 10.1063/1.4764067
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Current dependence of electro-optical parameters in green and blue (AlIn)GaN laser diodes

Abstract: Articles you may be interested inImprovement of characteristics of InGaN-based laser diodes with undoped InGaN upper waveguide layer J. Appl. Phys. 112, 113105 (2012); 10.1063/1.4768287 High-power blue-violet AlGaN-cladding-free m-plane InGaN/GaN laser diodes Appl. Phys. Lett. 99, 171113 (2011); 10.1063/1.3656970 Optically pumped terahertz laser based on intersubband transitions in a GaN∕AlGaN double quantum well Modeling of transitions in Mn 2+ doped ZnS nanocrystals and predicting reduced lasing threshold cu… Show more

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Cited by 27 publications
(6 citation statements)
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“…Then the SE could be obtained from the slopes of the L-I plots above the threshold current. And the injection efficiency η inj and internal loss α i could be obtained using [31][32][33]:…”
Section: Resultsmentioning
confidence: 99%
“…Then the SE could be obtained from the slopes of the L-I plots above the threshold current. And the injection efficiency η inj and internal loss α i could be obtained using [31][32][33]:…”
Section: Resultsmentioning
confidence: 99%
“…It can be seen that the slope efficiency first decreases and then increases with thickness of u-GaN layer increasing. In fact, the slope efficiency is inversely proportional to the optical loss and it is proportional to the injection efficiency according to the analysis by Hager et al [18] Meanwhile, the injection efficiency should be in proportion to the barrier of the electron blocking layer, which means that the slope efficiency is also proportional to the barrier of the electron blocking layer. Therefore, optical distribution and barrier of electron blocking layer are calculated and shown in Figs.…”
Section: Resultsmentioning
confidence: 99%
“…According to the reports of Sizov et al OE72;73 , piezoelectric field hinders hole transport and holes are mainly confined in the QW nearest the p-side in the c-plane InGaN-based green LDs. However, according to the reports of Hager et al OE74;75 , holes can overflow from the green active region in the c-plane green LDs and recombine in the n-InGaN layer right below green active region. Zhang et al OE76 report that large amounts of holes can penetrate through seven In 0:4 Ga 0:6 N/GaN QWs with the assistance of piezoelectric field at high current density.…”
Section: Carrier Leakagementioning
confidence: 97%