Current Collapse Phenomena Investigation in Automotive-Grade Power GaN Transistors
Alfio Basile,
Filippo Scrimizzi,
Santi Agatino Rizzo
Abstract:This work analyzes the impact of working conditions on the current collapse (CC) phenomenon for an automotive GaN device. For this purpose, some sensing circuits have been compared to find the most suitable for the considered GaN family. Simulations of the testing schematic have been performed, a prototype board has been created, and some measurements have been taken. Finally, the work has investigated the effect on the CC of the input voltage, current level, switching frequency, and duty cycle. The key outcom… Show more
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