2013
DOI: 10.1088/0022-3727/46/16/165104
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CuO nanowires for inhibiting secondary electron emission

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Cited by 45 publications
(28 citation statements)
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“…The observed XPS proved to contradict the known reduction of AMP outlined above [27][28][29]37]. We suspect this is due to secondary electrons [39] generated in the experimental procedure effecting reduction of the virgin samples to a greater extent than the irradiated ones. EPR of Mo V centres generated a distinctive signal (g = 2.7737) corresponding to previous literature references [29,40], which increased in intensity with the redshift of the samples explored, as per Figures 4 and 5.…”
Section: Chemical Changes Induced In Amp Upon Irradiationmentioning
confidence: 74%
“…The observed XPS proved to contradict the known reduction of AMP outlined above [27][28][29]37]. We suspect this is due to secondary electrons [39] generated in the experimental procedure effecting reduction of the virgin samples to a greater extent than the irradiated ones. EPR of Mo V centres generated a distinctive signal (g = 2.7737) corresponding to previous literature references [29,40], which increased in intensity with the redshift of the samples explored, as per Figures 4 and 5.…”
Section: Chemical Changes Induced In Amp Upon Irradiationmentioning
confidence: 74%
“…Thus, understanding how SEE affects sheath stability is crucial to make predictions of channel wall lifetime.Recently, a new wall concept based nano-architected surfaces has been proposed to mitigate surface erosion and SEE [22][23][24][25]. Demonstration designs based on high-Z refractory materials have been developed, including architectures based on metal nanowires and nanofoams [26][27][28][29][30]. The idea behind these designs is to take advantage of very-high surface-to-volume ratios to reduce SEE and ion erosion by internal trapping and redeposition.…”
mentioning
confidence: 99%
“…< R ≤ P el =⇒ elastic scattering P el < R ≤ P el + P p =⇒ plasmon excitation P el + P p < R ≤ P el + P p + P c =⇒ conduction electron excitation P el + P p + P c < R ≤ 1 ≡ P el + P p + P c + P s =⇒ inner shell electron excitation(28) …”
mentioning
confidence: 99%
“…Second, the surface asperities can act as traps for emitted electrons that can be re-captured by the solid 14 . These shadowing effects are dominant in materials with high roughness 15 . Some authors [15][16][17] have worked on lowering the EEY by creating surface asperities chemically 15 , mechanically 16 or using laser engraving 17 .…”
mentioning
confidence: 99%