2011
DOI: 10.1016/j.jallcom.2011.08.016
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CuIn1−xAlxS2 thin films prepared by sulfurization of metallic precursors

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Cited by 20 publications
(8 citation statements)
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References 32 publications
(40 reference statements)
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“…On careful observation two important inferences can be observed: (i) the variation in peak broadening with substrate temperature and (ii) shift of A 1 mode towards larger wave number. The strong intense A 1 mode of chalcopyrite compounds in the Raman spectra generally located between the range 291-314 cm -1 and in addition to A l mode another weak peak observed at 350 cm -1 corresponds to B 2 (LO) mode of chalcopyrite [9]. No other minor phases were observed in X-ray diffraction and it is once again confirmed in Raman…”
Section: Raman Spectrasupporting
confidence: 61%
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“…On careful observation two important inferences can be observed: (i) the variation in peak broadening with substrate temperature and (ii) shift of A 1 mode towards larger wave number. The strong intense A 1 mode of chalcopyrite compounds in the Raman spectra generally located between the range 291-314 cm -1 and in addition to A l mode another weak peak observed at 350 cm -1 corresponds to B 2 (LO) mode of chalcopyrite [9]. No other minor phases were observed in X-ray diffraction and it is once again confirmed in Raman…”
Section: Raman Spectrasupporting
confidence: 61%
“…temperature in the prepared CIAS films as it is slightly deviated from Vegard's law. Basically in chalcopyrite type semiconductors A I B III C 2 VI , the tetragonal distortion is a vital parameter which is pure indication of unequal bond lengths between the A-C and B-C atoms [9]. The value of tetragonal distortion can be observed from c/a ratio ( Fig.…”
Section: X-ray Diffraction Analysismentioning
confidence: 99%
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“…It is observed that in addition to first and second peaks exhibited by thin films grown at room temperature, a third peak appeared at 2 ~ 55 0 and is designated to (312) orientation and belongs to crystalline CuAlS 2 chalcopyrite structure as confirmed by ICDD (card no. 01-074-7053) and previous work of [7] and [13]. Fig.…”
Section: Growth Of Cuals 2 Thin Filmsmentioning
confidence: 68%