Cu Pumping Analysis during Cu/SiO2 Hybrid Bonding using In-situ SPM Imaging
Ali Roshanghias,
Jaroslaw Kaczynski,
Ude Hangen
Abstract:The assessment of Cu pumping (also known as Cu extrusion) during thermal annealing is vital information for the successful execution of hybrid bonding as well as defect-free processing of the through silicon vias (TSV). Unpredicted Cu pumping can pose major reliability issues. Correspondingly, in this study, high-temperature analysis of Cu pumping was conducted utilizing in-situ scanning probe microscopic (SPM) imaging. Cu/SiO2 surfaces with recessed and protruded Cu topographies were produced by chemical mech… Show more
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