The crystallographic properties and ferroelectric state of BZT multilayer films which deposited on Si (100) substrate was studied in this work. XRD pattern peaks show that BaZr 0.1 T 0.9 O 3 and BaZr 0.08 Ti 0.92 O 3 are found wellcrystallized at 800 o C for 3 hours corresponding to vary annealed temperature. The BZT multilayerfilms are identified as tetragonal-perovskite structure. This is supported by the existence of a measured hysteresis loops which the instrument and the system is on own works.Fundamentally of theoretical in physics field, the Sawyer-Tower Circuit has been concluded to ferroelectric phenomenon analysis on sample of material with experimental result as P-E hysteresis curve.The Sawyer-Tower Circuit method was used to measure the electrical polarization with triangle wave signal at fixed frequencies 50 Hz( = 0), and maximum electrical field (E max) were injected continuously at the 40 Volt/cm. The system plotted the electrical field with respect to polarization (P-E curves), include its value. This data was used as a parameter for determining electric property of material. These results have shown the maximum value of electric field which could be used as measurement parameter. The highest maximum polarization, 34.12 µC/cm 2 , have been determined and obtained on BaZr 0.1 T 0.9 O 3 at 800 o C for 3 hours annealing process and its maximum electric field is noted to be about 38.3 Volt/cm on all samples.In the normal manner,theresultcan provide an explanation of polarization and electrical behavior of ferroelectric sample for further research.