2016
DOI: 10.1063/1.4961712
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Crystallographic features related to a van der Waals coupling in the layered chalcogenide FePS3

Abstract: We investigated the crystallographic structure of FePS3 with a layered structure using transmission electron microscopy and powder X-ray diffraction. We found that FePS3 forms a rotational twin structure with the common axis along the c*-axis. The high-resolution transmission electron microscopy images revealed that the twin boundaries were positioned at the van der Waals gaps between the layers. The narrow bands of dark contrast were observed in the bright-field transmission electron microscopy images below t… Show more

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Cited by 49 publications
(53 citation statements)
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“…The twinning is consistent with recent observations using x-ray and electron diffraction [18]. The sample predominantly consisted of one domain, however, with population ratios between the domains of 0.78 : 0.13 : 0.09.…”
Section: Neutron Diffractionsupporting
confidence: 91%
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“…The twinning is consistent with recent observations using x-ray and electron diffraction [18]. The sample predominantly consisted of one domain, however, with population ratios between the domains of 0.78 : 0.13 : 0.09.…”
Section: Neutron Diffractionsupporting
confidence: 91%
“…Allowing for inequivalent exchange interactions between equivalent neighbors might be a consideration. This may be justified as the magnetic phase transition is believed to be first order, with a concomitant distortion of the lattice at T N as observed in x-ray diffraction [18,41].…”
Section: Discussionmentioning
confidence: 91%
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“…Fe atoms and P atoms are sandwiched between S atoms layers to form the layer-shaped FePS 3 monoclinic symmetrical C2/m structure 9 . The lattice parameters are that a = 5.947 Å, b = 10.300 Å, c = 6.7222 Å, and β = 107.16° 21 . Optical microscope is used to identify the FePS 3 materials.…”
Section: Resultsmentioning
confidence: 99%
“…The experimental pattern exhibits slightly different intensity ratios, which is caused by preferred orientation of the crystallites, a phenomenon well documented for layered materials. [42][43][44][45] Because X-ray diffraction is not very sensitive to minute impurities, the presence of tiny amounts of a second phase cannot be excluded.…”
Section: Characterisation Of the Bulk Materialsmentioning
confidence: 99%