Crystallisation of Pb1−xCaxTiO3 ferroelectric thin films as a function of the Ca2+ content

Bretos, Íñigo; Ricote, J.; Jiménez, Ricardo; Mendiola, J.; Riobóo, R. J. Jiménez; Calzada, M. L.

doi:10.1016/j.jeurceramsoc.2005.03.051

Cited by 22 publications

(10 citation statements)

References 19 publications

(21 reference statements)

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“…Ca-modified lead titanate films are derived from solutions with higher heterogeneity than those of pure lead titanate. 38 It seems that grain growth is somehow , which can be attributed to a decrease of the cluster size due to the thickness reduction. 35 Although this difference may be an important factor, it should also be considered that the thermal decomposition of Ca 2+ and Pb 2+ reagents (in both cases acetates) are not the same either.…”

Section: Resultsmentioning

confidence: 99%

Fabrication of continuous ultrathin ferroelectric films by chemical solution deposition methods

et al. 2008

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The integration of ferroelectrics in nanodevices requires firstly the preparation of high-quality ultrathin films. Chemical solution deposition is considered a rapid and cost-effective technique for preparing high-quality oxide films, but one that has traditionally been regarded as unsuitable, or at least challenging, for fabricating films with good properties and thickness below 100 nm. In the present work we explore the deposition of highly diluted solutions of pure and Ca-modified lead titanates to prepare ultrathin ferroelectric films, the thickness of which is controlled by the concentration of the precursor solution. The results show that we are able to obtain single crystalline phase continuous films down to 18 nm thickness, one of the lowest reported using these methods. Below that thickness, the films start to be discontinuous, which is attributed to a microstructural instability that can be controlled by an adequate tailoring of the processing conditions. The effect of the reduction of thickness on the piezoelectric behavior is studied by piezoresponse force microscopy. The results indicate that films retain a significant piezoelectric activity regardless of their low thickness, which is promising for their eventual integration in nanodevices, for example, as transducer elements in nanoelectromechanical systems.

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Section: Resultsmentioning

confidence: 99%

Fabrication of continuous ultrathin ferroelectric films by chemical solution deposition methods

et al. 2008

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“…All of the characteristic peaks of PZT, especially the (110) peak, become much stronger and sharper as the annealing temperature increases. The full width at half-maximum (FWHM) is considered in evaluating the quality of the PZT thin film [23,24]. Figure 1(b) indicates the FWHM of the perovskite phase peak (110) as a function of the annealing temperature.…”

Section: Crystalline Phase Of Pzt Thin Filmmentioning

confidence: 99%

Effect of microwave annealing temperatures on lead zirconate titanate thin films

Bhaskar

Chang

et al. 2007

Nanotechnology

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Lead zirconate titanate (Pb(1.1)(Zr(0.52)Ti(0.48))O(3)) thin films of thickness 260 nm on Pt/Ti/SiO(2)/Si substrates were densified by 2.45 GHz microwave annealing. The PZT thin films were annealed at various annealing temperatures from 400 to 700 °C for 30 min. X-ray diffraction showed that the pyrochlore phase was transformed to the perovskite phase at 450 °C and the film was fully crystallized. The secondary (again pyrochlore) phase was observed in the PZT thin films, which were annealed above 550 °C. The surface morphologies were changed above 550 °C of the PZT thin films due to the secondary phase. Higher dielectric constant (ε(r)) and lower dielectric loss coercive field (E(c)) were achieved for the 450 °C film than for the other annealed films.

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“…The higher relative XRD intensity can indicate an improved crystallinity, an increase of grain sizes and the presence of reduced amounts of the amorphous phase. The splitting of the peaks at 2θ of (001)/(100) and (110)/(101) was clearly observed meaning that at 500°C these films begin to crystallize in the tetragonal perovskite phase [14].…”

Section: Methodsmentioning

confidence: 99%

Annealing temperature dependence of local piezoelectric response of (Pb,Ca)TiO3 ferroelectric thin films

Capeli

Chiquito

Bastos

et al. 2017

Ceramics International

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In this work, we have systematically investigated the piezo/ferroelectric response of (Pb, Ca)TiO 3 thin films prepared by polymeric precursor method using simultaneously topography, piezoresponse force microscopy (PFM) and local piezoelectric hysteresis loop measurements. The thin films were grown on Pt/Ti/SiO 2 /Si substrates and annealed at 400, 500 and 600°C and subjected to structural characterization using x-ray diffraction, infrared and micro-Raman spectroscopy. The ferroelectric domains structure and the piezoelectric response evolved as a function of thermal annealing temperature as well as the density of active grains (number of switchable domains) progressively increased. Another important characteristic of these films is the onset of large area showing the coexistence of active (stronger piezoresponse signal) and inactive (weak or non piezoresponse signal) grains embedded in the polycrystalline perovskite matrix. A combination of out-of-plane (OP) and in-plane (IP) PFM images revealed local features of polarization component magnitudes in samples surface. Well-defined local piezoelectric hysteresis loop was achieved on top of individual nanometer-scale grains in both samples annealed at 500 and 600°C, and the switching behavior is evident.

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Crystallisation of Pb1−xCaxTiO3 ferroelectric thin films as a function of the Ca2+ content

Cited by 22 publications

References 19 publications

Fabrication of continuous ultrathin ferroelectric films by chemical solution deposition methods

Fabrication of continuous ultrathin ferroelectric films by chemical solution deposition methods

Effect of microwave annealing temperatures on lead zirconate titanate thin films

Annealing temperature dependence of local piezoelectric response of (Pb,Ca)TiO3 ferroelectric thin films

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