Crystallisation of magnetron sputtered amorphous Si_1−xC_xfilms (x= 1/3) studied by grazing incidence X-ray diffractometry

Elaboration of porous silicon carbide by soft templating molecular precursors with semi-fluorinated alkanes

“…The size of these domains can be estimated by applying the Scherrer equation to the above-mentioned Bragg peaks. 46,47…”