2007
DOI: 10.1016/j.apsusc.2006.10.055
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Crystalline quality of 3C-SiC formed by high-fluence C+-implanted Si

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Cited by 12 publications
(8 citation statements)
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“…Therefore, we observed a diffraction peaks at 2 = 18.8°and 34.22°along with sharp 3C-SiC ͕220͖ peak at 2 = 61.7°. 32 The peak at 18.8°corresponds to adamantane ͕200͖, while 34.22°shows the presence of carbon ͕123͖. The experimental 2 values of carbon are consistent with the standard JCPDS values ͑JCPDS file no.…”
Section: Resultssupporting
confidence: 73%
“…Therefore, we observed a diffraction peaks at 2 = 18.8°and 34.22°along with sharp 3C-SiC ͕220͖ peak at 2 = 61.7°. 32 The peak at 18.8°corresponds to adamantane ͕200͖, while 34.22°shows the presence of carbon ͕123͖. The experimental 2 values of carbon are consistent with the standard JCPDS values ͑JCPDS file no.…”
Section: Resultssupporting
confidence: 73%
“…In addition to Si peaks, we also notice that there is a peak at 61.7 corresponding to crystalline 3C-SiC(220). 21,22) However, we did not observe any graphite peak, implying that the graphite fraction is insignificant compared to diamond phase. Furthermore, the micro-Raman spectrum in Fig.…”
mentioning
confidence: 54%
“…The SAED pattern ( Figure 4 b insert) shows clear six-fold symmetry, indicating single crystalline hexagonal structure in this region [ 22 , 23 ]. Since SFBs are observed in the TEM image in Figure 3 d insert and Figure 4 a, the SAED also displays a ring pattern [ 24 ].…”
Section: Resultsmentioning
confidence: 99%