Crystal structure of zirconia by Rietveld refinement

Wang, Daning; Guo, Yongyong; Liang, Kun; Tao, Kun

doi:10.1007/bf02872053

Cited by 82 publications

(42 citation statements)

References 12 publications

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“…3. The starting structural models were taken from Ban and Okada 26 for mullite, selecting the temperatures closer to that of body firing (1400 and 1600 • C); from Oetzel and Heger 27 for corundum, for zirconia polymorphs from Wang et al 28 , and for rutile from the database NIST. 29 Up to 40 independent variables were refined: phase fractions, zero point, 15-20 coefficients of the shifted Chebyschev function to fit the background, unit cell parameters, profile coefficients (one Gaussian, G w , and one Lorentzian term, L x ).…”

Section: Methodsmentioning

confidence: 99%

Phase composition of alumina–mullite–zirconia refractory materials

Zanelli¹,

Dondi²,

Raimondo³

et al. 2010

Journal of the European Ceramic Society

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Section: Methodsmentioning

confidence: 99%

Phase composition of alumina–mullite–zirconia refractory materials

Zanelli¹,

Dondi²,

Raimondo³

et al. 2010

Journal of the European Ceramic Society

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“…Cubic zirconia (Figure 1(c)), exhibiting the CaF 2 structure, also features cubically coordinated zirconium atoms (undistorted). 10 It is to be noted that the images in These three structures comprise the majority of the phase diagram at the zirconia-rich side (see below for a discussion of the phase diagrams). There have been several other proposals in the past, most describing ordered structures, such as Zr 3 Y 4 O 12 , in a rhombohedral structure, 11 as depicted in Figure 1(d).…”

Section: Introductionmentioning

confidence: 99%

From zirconia to yttria: Sampling the YSZ phase diagram using sputter-deposited thin films

et al. 2016

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Yttria-stabilized zirconia (YSZ) thin films with varying composition between 3 mol% and 40 mol% have been prepared by direct-current ion beam sputtering at a substrate temperature of 300 °C, with ideal transfer of the stoichiometry from the target to the thin film and a high degree of homogeneity, as determined by X-ray photoelectron and energy-dispersive X-ray spectroscopy. The films were analyzed using transmission electron microscopy, revealing that, while the films with 8 mol% and 20 mol% yttria retain their crystal structure from the bulk compound (tetragonal and cubic, respectively), those with 3 mol% and 40 mol% Y2O3 undergo a phase transition upon sputtering (from a tetragonal/monoclinic mixture to purely tetragonal YSZ, and from a rhombohedral structure to a cubic one, respectively). Selected area electron diffraction shows a strong texturing for the three samples with lower yttria-content, while the one with 40 mol% Y2O3 is fully disordered, owing to the phase transition. Additionally, AFM topology images show somewhat similar structures up to 20 mol% yttria, while the specimen with the highest amount of dopant features a lower roughness. In order to facilitate the discussion of the phases present for each sample, a thorough review of previously published phase diagrams is presented.

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“…The reflection conditions for t ‐phase ( P 4 2 / nmc ) are that h + k =2 n for ( hk 0) t , l =2 n for ( hhl ) t , l =2 n for (00 l ) t , and h =2 n for ( h 00) t 35 . For m ‐phase ( P 2 1 / c ), that are h + l = 2 n for ( h 0 l ) m , k = 2 n for (0 k 0) m , h = 2 n for ( h 00) m , and l = 2 n for ( l 00) m 35 . The twin boundary in the (or ) plane is almost parallel to (110) t (Figs.…”

Section: Resultsmentioning

confidence: 99%

The m–t Transformation and Twinning Analysis of Hot‐Pressed Sintered 3YSZ Ceramics

Chiang

2011

Journal of the American Ceramic Society

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Microstructures of 3 mol% yttria‐stabilized zirconia (3YSZ) with different content of TiN were investigated in this study by XRD, SEM, and TEM. The specimens were hot‐pressing sintered at 1450°C for 2.5 h under 50 MPa in vacuum, and then further characterized on microstructure change and phase distribution. The TiN added to 3YSZ can suppress tetragonal (t) to monoclinic (m)‐3YSZ phase transformations, reduce 3YSZ grain size, and improve its mechanical properties. The ceramic was formed of homogeneously dispersed 3YSZ and TiN grains with average size of 0.7 and 1 μm, respectively. The coexistence of t‐ and m‐phases was observed in one grain, and the nucleation of m‐phase with acicular twin occurred preferentially at grain boundaries of t‐phase. The TEM analysis was focused on the 3YSZ–30 wt% TiN specimens in order to identify the relationships between t‐ and m‐structures, and twin structures of m‐phase. Two crystallographic relations of t‐ to m‐transformation are (100)m//(110)t, [010]m//[001]t in type I, and (100)m//(110)t, [001]m//[001]t in the type II. The acicular (100)m and lathlike (110)m twins in m‐phase were also observed.

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Crystal structure of zirconia by Rietveld refinement

Cited by 82 publications

References 12 publications

Phase composition of alumina–mullite–zirconia refractory materials

Phase composition of alumina–mullite–zirconia refractory materials

From zirconia to yttria: Sampling the YSZ phase diagram using sputter-deposited thin films

The m–t Transformation and Twinning Analysis of Hot‐Pressed Sintered 3YSZ Ceramics

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