2004
DOI: 10.1016/j.jallcom.2004.03.117
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Crystal structure of the CuIn7Se11 compound

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Cited by 14 publications
(15 citation statements)
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References 4 publications
(6 reference statements)
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“…Figure 1e shows the x-ray diffraction patterin of as fabricated CIS crystal. The x-ray pattern matched very well with previous study, [36] and the three major diffration peaks are label as former study. [23] All this evidence confirms the successful synthesis of high quality CIS crystals.…”
Section: Resultssupporting
confidence: 88%
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“…Figure 1e shows the x-ray diffraction patterin of as fabricated CIS crystal. The x-ray pattern matched very well with previous study, [36] and the three major diffration peaks are label as former study. [23] All this evidence confirms the successful synthesis of high quality CIS crystals.…”
Section: Resultssupporting
confidence: 88%
“…[ 23,36] CIS atomic layers were exfoliated from the bulk crystal by the Scotch tape exfoliation method and transferred onto a silicon wafer with a 285 nm thermal oxidation layer. .…”
Section: Resultsmentioning
confidence: 99%
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