2012
DOI: 10.1016/j.jallcom.2012.05.065
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Crystal structure and microwave dielectric properties of (1−x)ZnTa2O6–xTiO2 ceramics

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Cited by 24 publications
(15 citation statements)
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“…The observed diffraction peaks of ZnAl 2 O 4 doped with TiO 2 are consistent with these previously reported [10][11][12]. Furthermore, the peak positions of the phases shift slightly toward higher angles with increasing TiO 2 , which indicates that the cell volume of the spinel phase increases gradually due to the ionic radius of TiO 2+ (0.94 nm) [13] being larger than that of Zn 2+ (0.74 nm) [14] in the TiO 2 -doped ZnAl 2 O 4 compound. The XRD diffraction peaks shift to higher angle with increasing x value, which tends to decrease the lattice parameter (a).…”
Section: Experiments and Discussionsupporting
confidence: 90%
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“…The observed diffraction peaks of ZnAl 2 O 4 doped with TiO 2 are consistent with these previously reported [10][11][12]. Furthermore, the peak positions of the phases shift slightly toward higher angles with increasing TiO 2 , which indicates that the cell volume of the spinel phase increases gradually due to the ionic radius of TiO 2+ (0.94 nm) [13] being larger than that of Zn 2+ (0.74 nm) [14] in the TiO 2 -doped ZnAl 2 O 4 compound. The XRD diffraction peaks shift to higher angle with increasing x value, which tends to decrease the lattice parameter (a).…”
Section: Experiments and Discussionsupporting
confidence: 90%
“…Increasing the amount of TiO 2 loading was also found to result in a linear increase in the crystallite size from 20.92 (x = 0.10) to 31.63 nm (x = 0.30). The crystallite size increased due to the ionic radius of Ti 2+ (0.94 nm) [13] being larger than that of Zn 2+ (0.74 nm).…”
Section: Experiments and Discussionmentioning
confidence: 99%
“…Furthermore, the peak positions of the phases shift slightly toward the higher angle with increasing x, which suggests a reduction in the unitcell dimension due to the improvement of crystallizability. The phenomenon of peak shifts has also been discussed in previous papers by Lei et al [7] and Park et al [14]. The XRD diffraction peaks shift to the higher degree, tend to decrease the lattice parameter (a) [15], and is able to increase the ceramic densities [14].…”
Section: Resultsmentioning
confidence: 74%
“…The calculated crystallite size of ZnAl 2 O 4 is 21.44 nm. As x increased, the crystallite size of the Zn (1 -x) Ti x Al 2 O 4 thin films increased from 21.44 to 39.63 nm due to a larger ionic radii of TiO 2 (0.94 nm) [14]. The increase in the crystallite size was in parallel with TiO 2 loading due to the requirement of high energies for the Ti 2?…”
Section: Resultsmentioning
confidence: 99%
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