2018
DOI: 10.1016/j.jallcom.2018.07.120
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Crystal structure and local ordering in epitaxial Fe100−Ga /MgO(001) films

Abstract: In this work we present a study of the structural properties of Fe 100−x Ga x (x<30) films grown by Molecular Beam Epitaxy on Mg0(100). We combine long range and local/chemically selective X-ray probes (X-ray Diffraction and X-ray absorption spectroscopy) together with real space imaging by means of Transmission Electron Microscopy and surface sensitive in situ Reflected High Energy Electron Diffraction. For substrate temperature T s below 400 o C we obtain bcc films while, for x ≈ 24 and T s ≥ 400 o C the nuc… Show more

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Cited by 9 publications
(15 citation statements)
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“…The samples are referred in the text with two of numbers describing composition and thickness, thus 13-17 stands for the film with Ga content 13 % and t f = 17 nm. Figure 1 shows atomic force microscopy images on films grown at T s = 150 o C and T s = 600 o C with bcc crystal structure [17]. The image of the films grown at T s = 150 o C, obtained from sample 24-20, is representative of the topography of the films studied by MFM.…”
Section: A Thin Film Preparationmentioning
confidence: 99%
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“…The samples are referred in the text with two of numbers describing composition and thickness, thus 13-17 stands for the film with Ga content 13 % and t f = 17 nm. Figure 1 shows atomic force microscopy images on films grown at T s = 150 o C and T s = 600 o C with bcc crystal structure [17]. The image of the films grown at T s = 150 o C, obtained from sample 24-20, is representative of the topography of the films studied by MFM.…”
Section: A Thin Film Preparationmentioning
confidence: 99%
“…Magnetic force microscopy images presented in Fig 2a) shows lines on the film surface, interpreted as magnetic domain walls, separating areas without contrast, indicating that M is confined in the plane, and also some tip induced features; the image displayed in Fig 2b, taken for film 24-20, shows a fine structure which is not observed in the areas separated by the domains walls of the image 2a for film [13][14][15][16][17]. Fig 2c and 2d shows the same kind of magnetic contrast, revealing a non uniform magnetic configuration, in more detail for films with 28-56 and 28-21, respectively.…”
Section: B Magnetic Force Microscopy Imagesmentioning
confidence: 99%
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“…19 To study the local range order, the use of X-ray absorption fine structure (XAFS) measurements are crucial since they can provide information about the electronic structure and local geometry of the scattering atom when using x-ray absorption near edge structure (XANES), and about the degree of disorder by means of extended x-ray absorption fine structure (EXAFS). 9,[19][20][21][22] In the sputtering process, neutrals (atoms ejected from the target upon the impact of energetic particles) suffer collisions on their movement from the target to the substrate. [23][24][25] If the number of collisions is low, neutrals keep their momentum and energy till the substrate, and the sputtering growth takes place under ballistic flow.…”
Section: Introductionmentioning
confidence: 99%
“…The selective diffusion layer formed a composite characteristic between E values of alumina and steel, whereas on the main steel substrate, it remained unchanged for approximately 200.0 GPa, in agreement with the typical Young's modulus ranges of steel. The increased Young's modulus value of this compared to the steel substrate was attributed to the presence of the dominant Fe-Mg-O combination that had good corrosion resistance and mechanical hardness nature [24,25], considering this layer was fabricated with the carbide layer (C, Ca, Cr, and Si elements). A similar behaviour on the Mn-based selective diffusion layer offered higher hardness.…”
Section: Resultsmentioning
confidence: 99%