2015
DOI: 10.1002/pssb.201552168
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Crystal orientations of β‐Ga2O3 thin films formed on n‐plane sapphire substrates

Abstract: We have used X‐ray pole figure analysis to study crystal orientations of β‐Ga2O3 thin films deposited on (113) n‐plane sapphire substrates by gallium evaporation in oxygen plasma. The films were strongly (−201)‐oriented. However, the (−201) plane of β‐Ga2O3 on the (113) n‐plane sapphire was inclined along the (110) a‐plane. Crystals of (−201)‐oriented β‐Ga2O3 exhibit a threefold symmetry in which the β‐Ga2O3 crystal is rotated by increments of 120° from the direction of the c‐axis on the a‐plane of sapphire. T… Show more

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(3 citation statements)
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“…The XRD observations in Figure support the hypothesis that the β-Ga 2 O 3 / r -cut sample has a larger mosaicity degree and the crystalline orientation of the grains are not aligned with the surface of the r -cut sapphire substrate. Instead, the ( true 2 ̅ 01) plane of β-Ga 2 O 3 are aligned with the (113) or (2 true 1 ̅ 3) plane of the r -cut sapphire substrate. This corresponds to a 3-fold symmetry arrangement of the β-Ga 2 O 3 ( true 2 ̅ 01) plane rotated at every 120° angle on two of the (113) or (2 true 1 ̅ 3) planes of the sapphire substrate, which are inclined by ±27° from the r -cut plane . DUV reflectance and Raman mode anisotropy of the β-Ga 2 O 3 / r -cut shown in Figures and are due to the ( true 2 ̅ 01) β-Ga 2 O 3 crystal tilted arrangement with the (113) or (2 true 1 ̅ 3) sapphire substrate orientations. , On the other hand, the β-Ga 2 O 3 / c -cut crystalline orientation is aligned with the sapphire c -cut plane resulting in an isotropic DUV reflectance and Raman mode.…”
Section: Resultsmentioning
confidence: 99%
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“…The XRD observations in Figure support the hypothesis that the β-Ga 2 O 3 / r -cut sample has a larger mosaicity degree and the crystalline orientation of the grains are not aligned with the surface of the r -cut sapphire substrate. Instead, the ( true 2 ̅ 01) plane of β-Ga 2 O 3 are aligned with the (113) or (2 true 1 ̅ 3) plane of the r -cut sapphire substrate. This corresponds to a 3-fold symmetry arrangement of the β-Ga 2 O 3 ( true 2 ̅ 01) plane rotated at every 120° angle on two of the (113) or (2 true 1 ̅ 3) planes of the sapphire substrate, which are inclined by ±27° from the r -cut plane . DUV reflectance and Raman mode anisotropy of the β-Ga 2 O 3 / r -cut shown in Figures and are due to the ( true 2 ̅ 01) β-Ga 2 O 3 crystal tilted arrangement with the (113) or (2 true 1 ̅ 3) sapphire substrate orientations. , On the other hand, the β-Ga 2 O 3 / c -cut crystalline orientation is aligned with the sapphire c -cut plane resulting in an isotropic DUV reflectance and Raman mode.…”
Section: Resultsmentioning
confidence: 99%
“…We determined the full width at half-maximum (fwhm) of the β-Ga 2 O 3 diffraction peaks at ( 02) and (402) as 0.206° and 0.884°, respectively, for the c -cut and r -cut samples. The wider diffraction pattern peaks of the β-Ga 2 O 3 / r -cut suggests the crystalline grains were arranged with a higher mosaicity, when compared to the c -cut, or the ( 02) direction of the β-Ga 2 O 3 crystal orientation does not align with the r -cut plane. …”
Section: Resultsmentioning
confidence: 99%
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