2006
DOI: 10.1016/j.susc.2006.02.012
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Crystal orientation in poly(ethylene 2,6-naphthalate) ultrathin films revealed by reflection–absorption infrared spectroscopy and grazing incidence X-ray diffraction

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Cited by 11 publications
(7 citation statements)
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“…The crystallization kinetics in ultrathin polymer films have been investigated by several spectroscopic techniques in both isothermal, i.e., annealing at a temperature T a between the glass transition temperature T g and the melting point T m , and nonisothermal conditions. As a general trend, it was found that the rate of crystallization strongly decreases upon reducing the thickness, leading to an increase of the half crystallization time t 1/2 up to several orders of magnitude compared to the bulk conditions. Temperatures scans revealed that the cold crystallization temperature T CC , defined as the temperature where t 1/2 ( T ) shows a minimum, increases with a reduction of the thickness of the polymer layer.…”
mentioning
confidence: 99%
“…The crystallization kinetics in ultrathin polymer films have been investigated by several spectroscopic techniques in both isothermal, i.e., annealing at a temperature T a between the glass transition temperature T g and the melting point T m , and nonisothermal conditions. As a general trend, it was found that the rate of crystallization strongly decreases upon reducing the thickness, leading to an increase of the half crystallization time t 1/2 up to several orders of magnitude compared to the bulk conditions. Temperatures scans revealed that the cold crystallization temperature T CC , defined as the temperature where t 1/2 ( T ) shows a minimum, increases with a reduction of the thickness of the polymer layer.…”
mentioning
confidence: 99%
“…This is consistent with the result derived from the RAIR spectra. The c -axis (main chain of PEN molecule) can also be proved to align along the direction parallel to the sample surface in terms of the comparison of IR transmission and RAIR spectra . Moreover, in the case of out-of-plane geometry, the intensity of (100) reflection displays very strong in peak intensity, while this peak cannot be observed for the in-plane geometry.…”
Section: Resultsmentioning
confidence: 99%
“…The in-plane grazing incidence X-ray diffraction (GIXRD) was used to investigate the crystalline structure perpendicular to the substrate surface ( Figure S2, Supporting Information). [38,39] The in-plane GIXRD characteristics of single crystallization were tested at small incident angle (α i ) and reflection angle (α f ) values of 0.2º and 0.4º, respectively. As shown in Figure S3, Supporting Information, the in-plane GIXRD results show a single diffraction peak at 23.6° and 29.9°, respectively, corresponding to the crystalline reflections of (200) and (020) planes.…”
Section: Growth and Characteristics Of Ambipolar Crystalsmentioning
confidence: 99%