Crystalline, molecularly thick organic films mimicking layer
motifs observed in bulk
crystals of conducting (ET)2X charge-transfer salts (ET =
bis(ethylenedithiolo)tetrathiafulvalene, X = I3, ReO4) form on highly
oriented pyrolytic graphite (HOPG) electrodes upon
electrochemical oxidation of ET in electrolytes containing
I3
- or ReO4
-
anions. The assembly
of these molecular overlayers can be observed directly by in situ
atomic force microscopy
(AFM), and their structures can be deduced from lattice images obtained
by AFM under
growth conditions. AFM data reveal two different
(ET)2I3 overlayers that are
distinguished
by the orientation of the ET molecules. One of these overlayers
(type I) exhibits lattice
structure and thickness corresponding to the (001) layer of bulk
β-(ET)2I3, while the other
(type II) exhibits structural characteristics consistent with a
slightly reconstructed version
of the (1̄10) layer in crystalline
β-(ET)2I3. In contrast,
(ET)2ReO4 overlayers exhibit
only
the type II orientation, which resembles the (011) layer of bulk
(ET)2ReO4. Comparison of
the overlayer azimuthal orientation with respect to the underlying HOPG
substrate,
determined directly by AFM, reveals that each overlayer forms by
coincident epitaxy in which
strict commensurism is achieved only at the vertexes of a supercell
comprising an array of
primitive unit cells. The observed azimuthal orientations are in
agreement with values
predicted by either potential energy calculations or an analytical
model of the overlayer−substrate interface. Strong two-dimensional intralayer interactions
in the type I (001)
β-(ET)2I3 overlayer and a coincident lattice
match favor the formation of a crystalline layer
in which the structure mimicks the bulk layer structure. However,
the type II overlayers
are oriented such that only one strong intralayer bonding vector
remains, facilitating slight
reconstructions from the bulk layer structures so that coincidence can
be achieved.
Calculations of overlayer−substrate and overlayer energies and
elastic constants indicate
that although coincident epitaxy between the (001)
(ET)2ReO4 overlayer and HOPG is
possible, the accumulation of interfacial stresses from noncommensurate
overlayer sites
within its large supercell prevents its formation. These
observations, when combined with
analysis of the intralayer and overlayer−substrate elastic constants,
indicate that the
overlayer structure and its orientation with respect to the substrate
are governed by the
epitaxial relationship between the substrate and large ordered arrays
of molecules, reflecting
a delicate balance of intralayer and overlayer−substrate energetics.
The design strategy
based on bulk crystallographic layers and the overlayer−substrate
epitaxy represents a
“crystal engineering” approach to the fabrication of molecular thin
films.