Crystal c-axis mapping of hcp metals by conventional reflected polarized light microscopy: Application to untextured and textured cp-Titanium

Böhme, Luisa; Morales-Rivas, Lucía; Diederichs, Stella; Kerscher, Eberhard

doi:10.1016/j.matchar.2018.09.024

Cited by 20 publications

(5 citation statements)

References 21 publications

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“…Particularly, working with cross polarizer position, the brightness produced by the interaction of plane-polarized light with the polished surface of the sample is a function of [1]:…”

Section: Description Of C-axis Orientation Mapping Based On Polarizedmentioning

confidence: 99%

“…A recent method has been developed by the authors [1], a semi-automated approach for the previously explained analysis, involving PLM-based experimental procedure, computing-assisted processing of the pictures, and, under certain circumstances, calibration by means of EBSD. First, the sample on the stage of the microscope is rotated by steps of a certain number of degrees, acquiring a PLM picture every time.…”

Section: Description Of C-axis Orientation Mapping Based On Polarizedmentioning

confidence: 99%

“…It can be done by applying both the PLM method and an alternative reliable technique such as EBSD to the same area of the sample surface. For the same material, same surface conditions, and same settings of the microscope, a calibration curve for the conversion between the PLM-based sine amplitude into the EBSD-based inclination angle is calculated [1]. Otherwise, if the orientations of the grains contained within the PLM picture are randomly spread filling the whole Euler space, i.e., there is not texture, the calibration can be skipped.…”

Section: Description Of C-axis Orientation Mapping Based On Polarizedmentioning

confidence: 99%

“…In the case at hand, α-Ti, non-scanning plane-polarized light microscopy provides with a rapid overview of the microstructure and is still able to partly reveal local crystallographic information. When assisted by image processing tools, a semi-automated PLM c-axis orientation mapping is feasible [1], as will be later explained. The c-axis orientation in each grain is determined with respect to the light beam direction and to the light vibration plane, which can be "translated" into the sample reference frame (global coordinates).…”

Section: Introductionmentioning

confidence: 99%

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Orientation mapping of cp-Ti by reflected polarized light microscopy

2020

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Deformation and fracture mechanisms, and therefore mechanical behavior, in metals and metallic alloys with hexagonal close packed structures, such as α-Ti, strongly depend on the crystal c-axis orientation of the grains. Taking advantage of the intrinsic optical anisotropy that these structures present, a computer-aided method based on conventional reflected polarized light microscopy has been developed for c-axis orientation mapping. The application of the method on texture-free and textured commercially pure Ti is proposed for the examination of relevant crystallographic features.

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“…Particularly, working with cross polarizer position, the brightness produced by the interaction of plane-polarized light with the polished surface of the sample is a function of [1]:…”

Section: Description Of C-axis Orientation Mapping Based On Polarizedmentioning

confidence: 99%

Section: Description Of C-axis Orientation Mapping Based On Polarizedmentioning

confidence: 99%

Section: Description Of C-axis Orientation Mapping Based On Polarizedmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

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Orientation mapping of cp-Ti by reflected polarized light microscopy

2020

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“…This research used a reflective polarised light microscope to introduce a cheaper, faster and more straightforward approach to extract the quantitative information about the anisotropic crystals like HCP (Ti) (80,114). The success becomes more evident since we have invented Heilbronner and Pauli and the recent effort in 2018 by Jellison, G. E. However, this method is only applicable to fragile samples, and the accuracy is not comparable to the EBSD method.…”

Section: Chapter 4 Circular Polarised Light Microscopy (Cplm)mentioning

confidence: 99%

Quantitative polarised light microscopy of metals

Safaie¹

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For most engineering metals a material’s crystal structure can play a significant role in its performance in service. This is particularly relevant for materials that display pronounced differences in their physical properties depending on the arrangement and orientation of these crystals. Examples of such alloys are titanium and aluminium which are employed in a wide range of applications from medical to structural. Conventionally, the crystal structure of these materials is measured using various X-ray and electron diffraction techniques. Unfortunately, these are generally costly, time-consuming and therefore impractical in an industrial quality assurance setting. On-going research at Swansea University has demonstrated that a simpler alternative offers a solution to this problem. The project aimed to build on this research to develop a semi-automated method to conduct this analysis. The work involves extensive characterisation of various materials using optical and electron microscopes; this will focus on the direct correlation of electron diffraction data to polarised light microscopy. The project will concentrate on developing this apparatus to provide high quality, reliable information on material crystal structures. Electron Backscatter Diffraction (EBSD) is the most well-known approach to investigate the crystal orientation of polycrystalline material. However, when compared to optical microscopy EBSD is an expensive approach, very time consuming and complex laboratory technique needed to plot a crystal orientation map. The research offers a novel approach for optically anisotropic (titanium) and isotropic (aluminium) material to plot the crystal orientation map. The aim of the research is to offer a simpler, cheaper, and less time-consuming method which can be affordable by a middle-class company to have access to the crystal orientation map.

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