Cryogenic properties of a diamond sample at microwave frequencies

Abstract

International audienceDielectric resonators are key components for many microwave and millimetre wave applications, including high-Q filters and frequency-determining elements for precision frequency synthesis. Multilayered, bulk low-loss crystal and polycrystalline dielectric structures have become very important for designing these devices. Proper design requires careful electromagnetic characterisation of low-loss material properties. This includes exact simulation with precision numerical software and precise measurements of resonant modes. Diamond has been recently utilized for an increasing amount of electronic applications. This paper will present the common techniques for characterizing such dielectric samples in the microwave regime, and apply it to the characterization of diamond from 35 to 330K