2008
DOI: 10.1109/lpt.2008.2002731
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Crosstalk Reduction in a Shallow-Etched Silicon Nanowire AWG

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Cited by 40 publications
(16 citation statements)
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“…The spectral shapes of the different channels overlap very well, including the side-lobe structure. In order to clearly emphasize the minute differences in the side-lobe structures, the transmittance at the central channel T (16) was subtracted from every other output T (i) (i = 1-15 and 17-32) and shown in Fig. 2b.…”
Section: Review Articlementioning
confidence: 99%
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“…The spectral shapes of the different channels overlap very well, including the side-lobe structure. In order to clearly emphasize the minute differences in the side-lobe structures, the transmittance at the central channel T (16) was subtracted from every other output T (i) (i = 1-15 and 17-32) and shown in Fig. 2b.…”
Section: Review Articlementioning
confidence: 99%
“…The remaining noisy features should be attributed to the effective-index fluctuations (due to the thickness variation) in the second slab region because the difference in the light path only exists in the second slab region from array waveguides to different output port. It is www.lpr-journal.org 16 …”
Section: Review Articlementioning
confidence: 99%
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“…Effective-index fluctuations of the order of × determine the crosstalk values of the current Si-wire AWGs to be about -20 dB [11][12][13].…”
Section: Silicon Photonics Wdm Filtersmentioning
confidence: 99%
“…6 For a shallow-etched Si nanowire AWG with varied etch depths, the deviation in the core width is in the range of 3 to 8 nm. 7 Owing to small variations of ∼20 nm in the etching profile, one linear AWG device with the same core width and different etch depths were carried out to identify the adjacent XT and IL behavior. Using the same size of core width, the effect of birefringence was also analyzed in order to compensate the wavelength shift.…”
Section: Introductionmentioning
confidence: 99%