Crosstalk Noise Analysis in Coupled On-Chip Interconnects Using MRTD Technique

Abstract

In this paper, the Crosstalk noise analysis of coupled on-chip interconnects have been analyzed. The multiresolution time-domain method (MRTD) is used to analyze the crosstalk noise model. The crosstalk induced propagation time delay and crosstalk peak voltage on the victim line of interconnects have been determined and compared to those of the conventional finite difference time domain (FDTD) method and validated with HSPICE simulations at the 22nm technology node. The results of the proposed method shows that crosstalk induced propagation delay in dynamic in-phase, out-phase and peak voltage timing, as well as the peak voltage value for functional crosstalk in the copper interconnects are an average error of less than 0.53% for the proposed model and HSPICE simulations. The results of the proposed model are closely similar to those of HSPICE simulations. Electromagnetic interference and electromagnetic compatibility of on-chip interconnects can also be addressed using the proposed method.