Cross sections of X-ray production induced by C and Si ions with energies up to 1 MeV/u on Ti, Fe, Zn, Nb, Ru and Ta

Abstract

X-ray production differential cross sections induced by C and Si ions with energies from 1 MeV/u down to 0.25 MeV/u, produced by the CMAM 5 MV tandem accelerator, have been measured for thin targets of Ti, Fe, Zn, Nb, Ru and Ta in a direct way . X-rays have been detected by a fully characterized silicon drift diode and beam currents have been measured by a system of two Faraday cups. Measured cross sections agree in general with previously published results. The ECPSSR theory with the united atoms correction gives absolute values close to the experimental ones for all the studied elements excited by C ions and for Ta, Nb and Ru excited by Si ions. For Ti, Fe and Zn excited by Si, the basic ECPSSR theory gives better agreement, although on absolute values the gap for Ti is still large.

Cross sections of X-ray production induced on Ti, Fe, Zn, Nb and Ta by O, Cl, Cu and Br ions with energies between 4 MeV and 40 MeV

“…We have applied at CMAM a measuring protocol meant at extracting differential X-ray production cross sections excited by heavy ions from fundamental parameters and a data analysis procedure that takes into account target thickness effects. The protocol, which proved its validity for the cases of C and Si ions, as reported in a previous article [7], has been extended to O, Cl, Cu and Br ions, with energies of 1.66 MeV/u and below, on the same targets. Investigated elements included Ti, Fe, Zn, Nb and Ta.…”

“…The experimental set-up was described in connection with the measurement of cross sections for HI-PIXE induced by C and Si ions at the 5 MV tandem accelerator of the Centro de Micro-Análisis de Materiales (CMAM), Universidad Autónoma de Madrid (UAM), Spain. Full account of the beamline and end station, as well as of the detector performance and target sizes and composition can be found in a previous article [7]. We just recall that a few targets were distributed amongst the CRP partners.…”

“…The International Atomic Energy Agency (IAEA) has promoted a Coordinated Research Project (CRP F11019) [5] meant at consolidating, MeV-SIMS as an analytical technique and developing the combined application of quantitative Heavy-Ion PIXE (HI-PIXE) analysis. With this goal, a specific effort has been made by the CRP partners to increase the availability of X-ray production cross sections [6,7], in particular for the ion-target combinations that were identified as the most interesting for a combined MeV-SIMS and HI-PIXE sample characterization. Using the measurement protocols and data analysis procedures of our previous study [7] for C and Si ions, we have extended the investigation to the production of X-rays induced by O, Cl, Cu and Br ions with energies between 4 MeV and 40 MeV on thin targets of TiO2, Fe3O4, ZnO, Nb2O5 and Ta2O5 grown on different substrates.…”

“…With this goal, a specific effort has been made by the CRP partners to increase the availability of X-ray production cross sections [6,7], in particular for the ion-target combinations that were identified as the most interesting for a combined MeV-SIMS and HI-PIXE sample characterization. Using the measurement protocols and data analysis procedures of our previous study [7] for C and Si ions, we have extended the investigation to the production of X-rays induced by O, Cl, Cu and Br ions with energies between 4 MeV and 40 MeV on thin targets of TiO2, Fe3O4, ZnO, Nb2O5 and Ta2O5 grown on different substrates. This corresponds to a maximum of 1.66 MeV/u in the case of O ions and a minimum of 0.12 MeV/u when Br ions are used.…”

Focussing Protons from a Kilojoule Laser for Intense Beam Heating using Proximal Target Structures

“…Further, the heating would occur after the most intense proton isochoric heating (the fastest C ion arrives after 25 ps). Their contribution to Cu Kα through C particle-induced X-ray emission (PIXE) is expected to be significantly less than from proton PIXE because the carbons have fewer particles and lower PIXE cross-section based on limited measurements in the literature at lower projectile energy in Cu 33 and comparable projectile energy in Zn 34 .…”