2017
DOI: 10.1016/j.tsf.2016.11.019
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Cross-sectional transmission electron microscope observation of Si clathrate thin films grown on Si (111) substrates

Abstract: By means of high-resolution transmission electron microscopy (HR-TEM) observations, and energy dispersive X-ray analyses performed with a scanning TEM (STEM-EDX), we evaluated the residual Na contents and the induced crystal strains in type-II Si clathrate films grown on a Si substrate and treated with iodine for Na elimination. Cross-sectional TEM and STEM-EDX observations verified the formation of the type-II Si clathrate thin film on the Si substrate. The guest-free (without any Na inclusion) clathrate crys… Show more

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Cited by 3 publications
(2 citation statements)
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“…And the correlation between the photos are ignored in the small angel X-rat scattering (SAXS) [12,13]. The diffract-before-destroy nature of serial nanocrystallography can be well applied into single-particle and solution scattering [6,[14][15][16][17][18]. Because the CXS can reveal more details information of the molecule's structure in solution as expected by Kam [19,20].…”
Section: Introductionmentioning
confidence: 99%
“…And the correlation between the photos are ignored in the small angel X-rat scattering (SAXS) [12,13]. The diffract-before-destroy nature of serial nanocrystallography can be well applied into single-particle and solution scattering [6,[14][15][16][17][18]. Because the CXS can reveal more details information of the molecule's structure in solution as expected by Kam [19,20].…”
Section: Introductionmentioning
confidence: 99%
“…It can also be used to compute the orientation of each particle. In addition, it can be used to reconstruct the three-dimension structure of the particles [6,7,8]. But there are also some limitations for it.…”
Section: Introductionmentioning
confidence: 99%