Cross-Calibration of Various SEE Test Methods Including Pulsed X-rays and Application to SEL and SEU

Augustin, G.; Mauguet, M.; Andrianjohany, N.; Chatry, N.; Bezerra, F.; Capria, Ennio; Sander, M.; Voss, K-O.

doi:10.1109/radecs47380.2019.9745662

Cited by 3 publications

(1 citation statement)

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“…The standard approach involves tests at the level of the basic components, following well-established test specifications [2][3][4]. However, owing to the rapid increase in the use of COTS components, the increase in the complexity of electronic flight systems, and the search for cost reduction in the NewSpace era, new alternative test methods are being sought, including alternative radiation sources [5,6] and tests at the level of the electronic system (which may mean the electronic board, satellite module, or even the whole satellite [7]; processor or SoC devices are understood in this paper to be components, contrary to what was proposed, e.g., in [8]).…”

Section: Introductionmentioning

confidence: 99%

System-Level Total Ionizing Dose Testing of Satellite Subsystems: EagleEye Microsatellite Case Study

Rajkowski,

Pustułka,

Bieda

et al. 2023

Electronics

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A system-level total ionizing dose test method of satellite subsystems is discussed in the context of the radiation qualification of a satellite. System-level tests are performed with high-energy X-rays, and the irradiation results of the key subsystems, including the on-board computer, attitude- and orbit-control-system computer, and battery management system, are presented and analyzed in terms of the repeatability of the results, the observability issues, and the importance of the test conditions. Furthermore, the main benefits of the system-level total ionizing dose tests of the given subsystems are discussed, as well as the risks related to performing tests at the system level.

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