1994
DOI: 10.1016/0921-4534(94)91061-8
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Critical current angle-dependent measurements of thin (15nm) chemically-derived YBa2Cu3O7−d films in fields to 5.5 T

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“…The highest value is observed for B_L c-axis (~b = 0). Similar behaviour has been reported by Liebenberg et al (1992), Hu et al (1992) on Bi-2223 tapes as well as on thin films by Fukami et al (1993).…”
Section: Temperature and Magnetic Field Dependencesupporting
confidence: 87%
“…The highest value is observed for B_L c-axis (~b = 0). Similar behaviour has been reported by Liebenberg et al (1992), Hu et al (1992) on Bi-2223 tapes as well as on thin films by Fukami et al (1993).…”
Section: Temperature and Magnetic Field Dependencesupporting
confidence: 87%