2001
DOI: 10.1088/0268-1242/16/5/318
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Critical behaviour of thermopower and conductivity at the metal-insulator transition in high-mobility Si-MOSFETs

Abstract: This letter reports thermopower and conductivity measurements through the metal-insulator transition for 2-dimensional electron gases in high mobility Si-MOSFET's. At low temperatures both thermopower and conductivity show critical behavior as a function of electron density which is very similar to that expected for an Anderson transition. In particular, when approaching the critical density from the metallic side the diffusion thermopower appears to diverge and the conductivity vanishes. On the insulating sid… Show more

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Cited by 30 publications
(29 citation statements)
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“…Furthermore, the resistive coupling from the back gate to the channel and the small offset current from the nanovoltmeter will result in an offset voltage in OPefghi . This offset voltage, which is present even at zero heater current and is unrelated to the thermoelectric effect, as previously noted in other semiconducting channels such as Si MOSFETs, 33 could make Seebeck measurements further unreliable (for more details see Appendix C). When the device is in the ON state (the focus of this paper and where the Seebeck coefficient data presented below are measured), the channel resistance is small and as a result these spurious effects become rather small and insignificant.…”
Section: Measurementmentioning
confidence: 81%
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“…Furthermore, the resistive coupling from the back gate to the channel and the small offset current from the nanovoltmeter will result in an offset voltage in OPefghi . This offset voltage, which is present even at zero heater current and is unrelated to the thermoelectric effect, as previously noted in other semiconducting channels such as Si MOSFETs, 33 could make Seebeck measurements further unreliable (for more details see Appendix C). When the device is in the ON state (the focus of this paper and where the Seebeck coefficient data presented below are measured), the channel resistance is small and as a result these spurious effects become rather small and insignificant.…”
Section: Measurementmentioning
confidence: 81%
“…33 As we get closer to the onset of the ON state, more parabolic behavior is observed in the open-circuit voltage (Figure 17c, blue curve) and finally it becomes completely parabolic once we are inside the ON regime of the FET (Figure 17c, red curve). Gate-dependent open-circuit voltage in the OFF state of the device for three different heater currents is shown in Figure 17d.…”
Section: C1 DC Measurementmentioning
confidence: 91%
“…On the insulating side the resistance resembles EfrosShklovskii hopping [4], which points towards the relevance of localized states and a soft gap in the density of states; also the thermopower has been interpreted in terms of an Anderson insulator [5]. From this point of view Anderson localization seems to be relevant for the transition.…”
Section: Introductionmentioning
confidence: 91%
“…5 Several attempts to identify such a metal have been made with thermopower as a probe in the apparently metallic regime, notably in low-density 2D electron or hole systems 6,7 and highmobility Si MOSFETs. 8 While these studies indicate a definite change in the conduction mechanism and/or critical behavior in thermopower near the transition point between insulator and apparent metal, an unambiguous demonstration of a metallic state has never been achieved. Much of the uncertainty could be due to the very nature of the transition which has been suggested to be an inhomogeneity-driven, classical percolation transition 9,10 rather than an interaction-induced one.…”
Section: Introductionmentioning
confidence: 99%