2014 20th International Conference on Microwaves, Radar and Wireless Communications (MIKON) 2014
DOI: 10.1109/mikon.2014.6899829
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Critical aspects adversely affecting accuracy of radiation pattern and polarization measurements with three spherical scanners at high microwave frequencies

Arkadiusz Byndas
1
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P. Kabacik
2
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Resolution in microwave holography computed with near-field samples acquired with the bi-polar antenna measuring system

Kabacik
1
,
Byndas
2
2014
2014 International Conference on Electromagnetics in Advanced Applications (ICEAA)
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Resolution in microwave holography computed with near-field samples acquired with the bi-polar antenna measuring system

Kabacik
1
,
Byndas
2
2014
2014 International Conference on Electromagnetics in Advanced Applications (ICEAA)
Self Cite
0
0
0
0
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show abstract
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