2003
DOI: 10.1016/s0921-5093(03)00205-3
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Creep of a TiAl alloy: a comparison of indentation and tensile testing

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Cited by 90 publications
(35 citation statements)
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“…Furthermore, impression creep avoids problems associated with localized stresses that characterize the tip region during indentation with sharp indenters. [17] The creep behavior of Mg alloys has been mainly studied by conventional tensile or compressive tests. In a few cases, however, localized creep test methods have been used to evaluate the creep behavior of different magnesium alloys.…”
Section: Introductionmentioning
confidence: 99%
“…Furthermore, impression creep avoids problems associated with localized stresses that characterize the tip region during indentation with sharp indenters. [17] The creep behavior of Mg alloys has been mainly studied by conventional tensile or compressive tests. In a few cases, however, localized creep test methods have been used to evaluate the creep behavior of different magnesium alloys.…”
Section: Introductionmentioning
confidence: 99%
“…5 In such cases, the material resistance to creep deformation is of great concern due mainly to the fact that the stress and strain concentrations at the solder joints must be effectively relaxed by creep to guarantee solder joint reliability. 15,16 It is therefore the aim of this paper to study the creep behavior of the Sn-9Zn-0.5Ag and Sn-9Zn-0.5Al alloys, compared with that of the eutectic Sn-9Zn alloy. This has been achieved using the impression creep testing technique, which has been widely used in the creep study of various solder materials.…”
Section: Introductionmentioning
confidence: 99%
“…12,13 Since the creep behavior of solders is strongly microstructure dependent, a significant body of the recent work on solder creep has been based on actual solder balls attached to packaging substrates, e.g., via impression creep. [14][15][16][17][18] In this test, a slightly flattened solder bump is loaded with a flat-tipped cylindrical indenter, producing a creep curve that is very similar to a compression creep curve. The test allows establishment of steady-state behavior within just a few hours, and enables testing of individual solder balls attached to microelectronic substrates.…”
Section: Introductionmentioning
confidence: 99%