CRC (Cyclic Redundancy Check) Implementation in High-Speed Semiconductor Memory

Lee, Joong-Ho

doi:10.1109/ca.2015.13

Cited by 3 publications

(2 citation statements)

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“…5(a) shows the implementation of SSCDSD. The code word with 18 symbols, (144, 128), includes 128-bit data and 16-bit ECC with 8-bit CRC and 8bit parity [55,56]. Four code words are composed of one cache line.…”

Section: ) Single Symbol Correction Double Symbol Detectionmentioning

confidence: 99%

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Review of Memory RAS for Data Centers

Lee,

Kim,

Kim

et al. 2023

IEEE Access

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Multi-bit error and downtime due to uncorrectable error (UE) in a dual in line memory module (DIMM) have received great attention in data centers for its high repair or replacement cost. These problems can be alleviated by utilizing ECC (Error Correction Code) technology, which enables prompt error correction during initial occurrences and prediction of future UEs based on recurring error patterns. The technologies for addressing errors can be categorized into reliability, availability, and serviceability (RAS), and need to be optimized using various parameters such as accuracy, recall, F-measures, and cost reduction. This paper describes an overview of the current RAS technologies and trends in memory for data centers, which includes an analysis of conventional ECC technologies and their recent developments. Once UEs cannot be completely eliminated with ECCs, page offline methods based on analysis on error patterns and characterization of UE can be performed. Recent research trends for reducing memory capacity wasted by UE and page offline have been towards on-die ECC in high bandwidth memory architecture. INDEX TERMSCorrectable error (CE), error correction code (ECC), memory reliability, availability, serviceability (RAS), and uncorrectable error (UE).

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Section: ) Single Symbol Correction Double Symbol Detectionmentioning

confidence: 99%

“…3) CYCLIC REDUNDANCY CHECK CRC detects accidental errors in computer data and is typically used in digital code transmitters/receivers and storage devices [55,56]. Various types of CRC depending on the divisor or polynomial generator exist.…”

Section: ) Single Symbol Correction Double Symbol Detectionmentioning

confidence: 99%