1992
DOI: 10.1016/0956-7151(92)90451-j
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Crack-tip dislocation emission arrangements for equilibrium —I. In situ TEM observations of Fe2wt%Si

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Cited by 75 publications
(20 citation statements)
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“…4. In such cases, different levels of crack tip shielding than at isolated cracks may be expected due to the interaction of dislocation densities surrounding neighbouring cracks [42][43][44] . This interaction may include-among other possibilities-enhanced annihilation of opposite sign dislocations 45 , generation of a greater number of statistically stored 'redundant' dislocations 46 , repulsion of like-signed dislocations and modified levels of cross-slip.…”
Section: Discussionmentioning
confidence: 99%
“…4. In such cases, different levels of crack tip shielding than at isolated cracks may be expected due to the interaction of dislocation densities surrounding neighbouring cracks [42][43][44] . This interaction may include-among other possibilities-enhanced annihilation of opposite sign dislocations 45 , generation of a greater number of statistically stored 'redundant' dislocations 46 , repulsion of like-signed dislocations and modified levels of cross-slip.…”
Section: Discussionmentioning
confidence: 99%
“…[8] The prevailing view on cleavage fracture is that there is a competition between the emission of dislocations and the propagation of a Griffith crack from the crack tip. [4,[9][10][11][12][13][14][15][16][17][18][19][20] The limiting stage in the dislocation emission process can either be the nucleation of dislocations at the crack tip [4,[9][10][11][12][13][14][15][16][17][18][19][20] or, once nucleated, the mobility of the dislocations propagating away from the crack tip. [21,22,23] In both cases, dislocation emission leads to shielding of the crack tip that results in an enhancement of fracture resistance.…”
Section: Introductionmentioning
confidence: 99%
“…3. Zielinski [6] reported an observation of a step-by-step crack growth for Fe-2 wt.% silicon and showed that the cleavage crack left 3.5 slip traces of residual dislocations for every 100 nm of crack growth, with an average of 18.6 dislocations per trace. Zhu et al [7] defined a Crack Tip Opening Angle (CTOA) where full dislocation emissions along the slip plane were assumed, omitting the slip deformation caused by incomplete dislocations.…”
Section: Resultsmentioning
confidence: 98%