“…Defect trap densities ( N trap ), calculated using the using the equation, [
46 ]
, where e is the elementary charge (1.6 × 10 −19 C), L is the thickness of the perovskite layer (≈500 nm from the cross‐sectional FESEM, Figure 6b), ε 0 is the permittivity of vacuum (≈8.854 × 10 −12 Fm −1 ), and ε is the relative dielectric constant of the MAPbI 3 layer (taken 28.8 [
47 ] ). The calculated
values for W & W/ o ‐TET PSCs, are 5.35 × 10 15 , and 7.77 × 10 15 cm −3 respectively and these values are similar to also similar to previously reported results.…”