Coupled ring resonator for microwave characterization of dielectric materials

Kapoor, Mahima; Daya, K. S.; Tyagi, G. S.

doi:10.1017/s1759078711001103

Cited by 5 publications

(4 citation statements)

References 6 publications

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“…In contrast to the measurement of , the loss tangent determination by ring-resonators is challenging. This is due to the fact that various loss mechanisms affect the quality factor Q of the resonator by additional partial quality factors [17] related to conductor loss Q c , dielectric loss Q d , and radiation loss Q r . Q describes the stored energy divided by the sum of all losses for each resonant cycle, leading to …”

Section: Measurement Resultsmentioning

confidence: 99%

A method for the determination of the complex permittivity by detuned ring resonators for bulk materials up to 110 GHz

Talai¹,

Steinhäußer

Bittner

et al. 2015

Int. J. Microw. Wireless Technol.

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An accurate characterization of microwave materials is essential for reliable high-frequency circuit design. This paper presents a measurement setup, which enables a quick and accurate determination of the relative permittivity of dielectric bulk materials up to 110 GHz. A ring-resonator is manufactured on a well-characterized substrate, serving as reference resonator. The material under test (MUT) is placed on top of the ring, which increases the effective permittivity and therefore introduces a shift of the resonance frequency of the resonator. In case of moderate to large dielectric losses of the MUTs, the quality factor of the resonator decreases perceptibly, which provides conclusions about the dielectric losses. Electromagnetic field simulations with different heights and relative permittivities of the MUTs provide a look-up table for the measured resonance frequencies. The functionality of the proposed measurement setup is validated by measurement results of different MUTs.

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Section: Measurement Resultsmentioning

confidence: 99%

A method for the determination of the complex permittivity by detuned ring resonators for bulk materials up to 110 GHz

Talai¹,

Steinhäußer

Bittner

et al. 2015

Int. J. Microw. Wireless Technol.

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“…Gap coupled ring resonator is shown in Fig. 3b [2]. It can also measure dielectric parameters of the PCB laminates.…”

Section: Set Of Measuring Cells For Pcb Materials Researchmentioning

confidence: 99%

“…7) using formulas as in [7]. α total(stripline) = α c(smooth) +α roughness + α substrate (1) α total(microstrip) = α' c(smooth) + α plating +α roughness + α substrate (2) α plating = α total(microstrip) -(α roughness + α substrate ) -α' c(smooth)…”

Section: Measurementsmentioning

confidence: 99%

Set of measuring test fixtures for PCB materials research

et al. 2019

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Designed and manufactured set of measuring test fixtures for printed circuit board (PCB) materials research and characterization is described in this article. Attention is paid to special designed test vehicle “General board” which includes six types of transmission lines that are used for PCB materials characterization by two measurement methods. Measurements of the frequency dependencies of the dielectric constant and dielectric loss for a number of the most widely used PCB substrates are presented. The comparison of the measurement results made by two measurement methods is also shown. The influence of the inhomogeneities of the PCB dielectric and some differences in the extracted material parameters data correlated with electro-magnetic fields structure in different transmission lines is demonstrated. In addition it is shown that measurements performed using “General board” can be used for characterization of the losses due to PCB surface plating.

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“…This technique operates over the frequency range of 4.8-8.7 GHz. Meanwhile, [65] designed a coupled ring resonator of dielectric characterization of a closed ring resonator (CRR) and split ring resonator (SRR) for three lengths such as λ , λ /2, and λ /4 with the coupling gap of 0/41mm. Authors used two types of samples, semi-liquid form for the bio sample and powder form for the ferromagnetic.…”

Section: Mixture Samplementioning

confidence: 99%

Planar Microwave Sensors for Accurate Measurement of Material Characterization: A Review

et al. 2017

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Microwave sensor is used in various industrial applications and requires highly accurate measurements for material properties. Conventionally, cavity waveguide perturbation, free-space transmission, open-ended coaxial probe, and planar transmission line technique have been used for characterizing materials. However, these planar transmission lines are often large and expensive to build, further restricting their use in many important applications. Thus, this technique is cost effective, easy to manufacture and due to its compact size, it has the potential to produce sensitivity and a high Q-factor for various materials. This paper reviews the common characteristics of planar transmission line and discusses numerous studies about several designs of the microstrip resonator to improve the sensor performance in terms of the sensitivity and accuracy. This technique enables its use for several industrial applications such as agriculture and quality control. It is believed that previous studies would lead to a promising solution of characterizing materials with high sensitivity, particularly in determining a high Qfactor resonator sensor.

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Coupled ring resonator for microwave characterization of dielectric materials

Cited by 5 publications

References 6 publications

A method for the determination of the complex permittivity by detuned ring resonators for bulk materials up to 110 GHz

A method for the determination of the complex permittivity by detuned ring resonators for bulk materials up to 110 GHz

Set of measuring test fixtures for PCB materials research

Planar Microwave Sensors for Accurate Measurement of Material Characterization: A Review

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