2008
DOI: 10.1088/0268-1242/23/12/125023
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Coupled modeling of current spreading, thermal effects and light extraction in III-nitride light-emitting diodes

Abstract: A hybrid approach to modeling of electrical, optical and thermal processes in state-of-the-art light-emitting diodes (LEDs) is described in detail. The advantages of the approach are demonstrated with reference to an interdigitated multipixel array (IMPA) chip design recently suggested to improve the LED performance at high-current operation. Such an LED, consisting of a hundred single-pixel light sources integrated on a common substrate, has a rather complex multi-scale geometry challenging for a coupled anal… Show more

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Cited by 40 publications
(34 citation statements)
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References 22 publications
(44 reference statements)
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“…Modelling of the LED operation was performed with commercial SimuLED package [3] providing coupled 3D analysis of electrical, thermal, and optical processes in the LED die (see [4] for more detail). Auger recombination in the InGaN QWs was accounted for as an important mechanism limiting the internal quantum efficiency (IQE) of the LED structure at high-current operation [5][6][7][8].…”
Section: Contributedmentioning
confidence: 99%
“…Modelling of the LED operation was performed with commercial SimuLED package [3] providing coupled 3D analysis of electrical, thermal, and optical processes in the LED die (see [4] for more detail). Auger recombination in the InGaN QWs was accounted for as an important mechanism limiting the internal quantum efficiency (IQE) of the LED structure at high-current operation [5][6][7][8].…”
Section: Contributedmentioning
confidence: 99%
“…To interpret the experimental results, we carried out coupled hybrid 1D/3D simulations of the current spreading in the LED chip and heat transfer in the LED chip and the submount [8]. The active area was regarded as a thin layer with the Shockley dependence of the local current density j p-n on the local applied p-n junction bias voltage U p-n :…”
Section: Simulationmentioning
confidence: 99%
“…Sophisticated models for this have been developed recently a) and were shown to accurately describe real existing devices. [17][18][19] Here, the current density is calculated by a finite difference model following a similar ansatz to that described by Bogdanov et al 18 Sections II A and II B explain the model. In Secs.…”
Section: Current Density Distributionmentioning
confidence: 99%