2020
DOI: 10.1016/j.ultramic.2020.112989
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Coupled Broad Ion Beam–Scanning Electron Microscopy (BIB–SEM) for polishing and three dimensional (3D) serial section tomography (SST)

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Cited by 23 publications
(24 citation statements)
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“…Very large volumes can be interrogated by TEM-based techniques: the traditional approach of serialsection TEM requires manual collection of consecutive thin (~50 nm) sections of stained, resin-embedded specimens which are then individually imaged [30,31], while GridTape TEM uses a tape-reel to help automate section collection and imaging [32]. Newer plasma focused ion beam (pFIB) or broad ion beam (BIB) [33,34] milling and X-ray microscopy (XRM) [35] approaches are being developed, but to our knowledge have not been shown to resolve viral particles in resin-embedded cell samples. Combinations of these approaches may smartly couple sparse sampling of a large volume with high-resolution imaging of a smaller region-of-interest (ROI) [35,36], but for brevity we do not discuss this here.…”
Section: Volume Electron Microscopymentioning
confidence: 99%
“…Very large volumes can be interrogated by TEM-based techniques: the traditional approach of serialsection TEM requires manual collection of consecutive thin (~50 nm) sections of stained, resin-embedded specimens which are then individually imaged [30,31], while GridTape TEM uses a tape-reel to help automate section collection and imaging [32]. Newer plasma focused ion beam (pFIB) or broad ion beam (BIB) [33,34] milling and X-ray microscopy (XRM) [35] approaches are being developed, but to our knowledge have not been shown to resolve viral particles in resin-embedded cell samples. Combinations of these approaches may smartly couple sparse sampling of a large volume with high-resolution imaging of a smaller region-of-interest (ROI) [35,36], but for brevity we do not discuss this here.…”
Section: Volume Electron Microscopymentioning
confidence: 99%
“…In this respect, 3D FIB-SEM is a very good compromise between resolution and volume size. Especially with the recent application of Xe plasma ion beam [18], broad Ar + beam [19], and Femtosecond laser [20], the analysing volumes can be increased largely.…”
Section: Fib-sem Tomographymentioning
confidence: 99%
“…The BIB milling process can be performed on a few millimeters of material and adjusted to the required depth 26 ; therefore, it is suitable for preprocessing cross-sections before SEM. In addition, BIB milling produces cross-sections with very low damage compared to FIB milling 27 , 28 . The setting of specimens on the BIB milling system is very easy, and the cross-section to be processed is positioned protruding from the shield plate several tens of micrometers 28 .…”
Section: Introductionmentioning
confidence: 99%
“…In addition, BIB milling produces cross-sections with very low damage compared to FIB milling 27 , 28 . The setting of specimens on the BIB milling system is very easy, and the cross-section to be processed is positioned protruding from the shield plate several tens of micrometers 28 . The protruded portion is then milled by BIB irradiation.…”
Section: Introductionmentioning
confidence: 99%