Counting individual atom layers in graphite – high-resolution RBS experiments on highly oriented pyrolytic graphite

Srivastava, S. K.; Plachke, D.; Szőkefalvi‐Nagy, A.; Major, J.; Carstanjen, H. D.

doi:10.1016/j.nimb.2004.01.083

Cited by 6 publications

(3 citation statements)

References 7 publications

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“…13 The most relevant one is that in the first few angstroms below the solid surface the ion energy loss departs from a symmetric, Gaussian distribution. In fact, the departure from a Gaussian energy-loss distribution has been recently observed for near-surface collisions 14,15 and is very important to get reliable depth profiles of heavy elements in very thin films. 16 Thus, standard energy-loss theories or semiempirical methods based on Gaussian energy-loss distributions cannot be used for depth profiling in the subnanometric scale.…”

Section: Introductionmentioning

confidence: 93%

Characterization of nanoparticles through medium-energy ion scattering

Sortica

Grande

Machado

et al. 2009

Journal of Applied Physics

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In this work we review the use of the medium-energy ion scattering ͑MEIS͒ technique to characterize nanostructures at the surface of a substrate. We discuss here how the determination of shape and size distribution of the nanoparticles is influenced by the energy loss at the backscattering collision, which leads to an asymmetrical energy-loss line shape. We show that the use of a Gaussian line shape may lead to important misinterpretations of a MEIS spectrum for nanoparticles smaller than 5 nm. The results are compared to measurements of gold nanoparticles adsorbed on a multilayered film of weak polyelectrolyte.

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Section: Introductionmentioning

confidence: 93%

Characterization of nanoparticles through medium-energy ion scattering

Sortica

Grande

Machado

et al. 2009

Journal of Applied Physics

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“…The fundamentals for monolayer resolution analytics using the energy loss of ionic projectiles is, besides the high energy filter resolution, grazing incidence or detection conditions (only few degrees with respect to the surface), because the ratio of the energy loss straggling to the mean energy loss decreases for increasing projectile pathlength. Recently, individual atom layers [5] (adatom and adlayers as well [6]) have been observed by backscattered measurements. In these experiments the interpretation of energy spectra is still an open question because this requires a detailed knowledge on the energy-transfer distribution, which cannot be simply approximated by a Gaussian distribution.…”

Section: Introductionmentioning

confidence: 99%

An analytical energy-loss line shape for high depth resolution in ion-beam analysis

Grande

Hentz

Pezzi

et al. 2007

Nuclear Instruments and Methods in Physics Research Section B:

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The knowledge of the energy-loss distribution in a single ion-atom collision is a prerequisite for subnanometric resolution in depth-profiling techniques such as Nuclear Reaction Analysis (NRA) and Medium Energy Ion-Scattering (MEIS). The usual Gaussian approximation specified by the stopping power and energy straggling is not valid for near surface regions of solids, where subnanometric or monolayer resolution can be achieved. In this work we propose an analytical formula for the line shape to replace the usual Gaussian distribution widely used in low-resolution ion-beam analysis. Furthermore, we provide a simple physical method to derive the corresponding shape parameters. We also present a comparison with full coupled-channel calculations as well as with experimental data at nearly single collision conditions.

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“…Nevertheless further progress has been made on the ex-perimental side. A few years back Srivastava et al [10] experimentally observed the surface enhancement in the stopping power of 1 MeV N + beam on highly oriented pyrolytic graphite. Recently Papaléo et al [11] reported direct evidence for a strong dependence of the surface modification as a function of charge state of the incident ions.…”

Section: Introductionmentioning

confidence: 99%