Abstract:Focused ion beam systems complement conventional processing methods and can be used to prototype and modify a diverse range of nano-devices and sensors. Controllable incident focused ion beam is difficult to obtain due to Coulomb interactions among ions. In this paper, Coulomb interactions of a practical FIB system with a dynamic corrected deflection field are obtained through solving Newton-Lorentz equations in three-dimension (3D). Firstly, the principle of the dynamic correction is analyzed and its 3D reali… Show more
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