Coulomb explosion of vertically aligned carbon nanofibre induced by field electron emission

Abstract

The direct observation and fundamental understanding of the carbon nanofiber disintegration process: a light emission followed by a Coulomb explosion.

In Situ Transmission Electron Microscope: Joule Heating Effect on Graphitization of Copper Incorporated Carbon Nanofiber

“…The current flow was up to 1 μA. The current would flow along the carbon nanofiber from the tip part through the outer surface and hence most of the structural change would occur from the outer layers [29], [34]. If the outer layer thickness is assumed to be 0.34 nm (corresponding to 1 layer thickness of graphene), the temperature of the outer layer during the applied bias voltage estimated from the above Eq.…”

Computational simulation and phenomenological analysis of freestanding carbon nanotube coulomb explosion induced by field emission

“…[9][10][11][12] However, recently, it was discovered for the first time by Li et al that there is another reason for CNT degradation, which is Coulomb explosion. 13 This is a more devastating and fatal phenomenon for FE. The Coulomb explosion is caused by the solid bonds of the CNTs being broken by the Coulomb repulsion of particles during the FE process.…”

“…14 Similar to the Coulomb explosion induced by direct electron beam exposure or chemical reaction, the CNTs are ionized during the current emission process, and the increase in the charge increases the Coulomb repulsion to exceed the limit of the bond energy between the carbon ions, finally causing an explosion. 13,15,16 Also, the Coulomb explosion usually induces strong arcing, which has a high chance of causing damage to the entire device. Compared to the evaporation of CNTs, FE-induced Coulomb explosion is more detrimental; thus, it must be investigated further in order to extend the lifetime of CNT emitters.…”

“…In our group's previous work, Li et al observed some signs of the explosion using a microscope camera. 13 However, the observation and recording of the whole explosion process are insufficient to obtain a complete understanding of this phenomenon (the cause and mechanism). Hence, more complete observation of this phenomenon is necessary to analyze its mechanism in more depth, and more comprehensive studies on the cause of its occurrence are required.…”

Molybdenum Disulfide Field Effect Transistors under Electron Beam Irradiation and External Electric Fields

“…FE is a quantum mechanical phenomenon in which electrons, extracted from a conductor or a semiconductor surface under application of an intense electric field, move in vacuum from a cathode to an anode. FE is used in a variety of applications, ranging from electrically-operated floating-gate memory cells [35,36], electron microscopy [37] and e-beam lithography [38] to display technology or vacuum electronics [39].…”