Could an open-source approach to test systems help the embedded systems industry?

Schulz, Peter; Sleibi, Noura; Wolff, Carsten; Hensen, Christian

doi:10.1109/autotestcon47465.2024.10697501

2024 Ieee Autotestcon 2024

DOI: 10.1109/autotestcon47465.2024.10697501

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Could an open-source approach to test systems help the embedded systems industry?

Peter Schulz,

Noura Sleibi,

Carsten Wolff

et al.

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Could an open-source approach to test systems help the embedded systems industry?

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References 7 publications

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