2008 Asia-Pacific Microwave Conference 2008
DOI: 10.1109/apmc.2008.4958130
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Corrosion reliability study of indium tin oxide (ITO) for chip-on-glass (COG)

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“…8 It is also crucial to note that evidence of device degradation due to indium contamination has been reported. [9][10][11] These factors often shorten the lifetime of electronic devices, sometimes even damaging them. Overall, while the supply of indium is limited, the demand for ITO has increased dramatically with the popularity of electronic displays, touch panels, e-paper, solar panels, and solid-state lighting, such that recovering and recycling indium has been considered quite seriously.…”
Section: Introductionmentioning
confidence: 99%
“…8 It is also crucial to note that evidence of device degradation due to indium contamination has been reported. [9][10][11] These factors often shorten the lifetime of electronic devices, sometimes even damaging them. Overall, while the supply of indium is limited, the demand for ITO has increased dramatically with the popularity of electronic displays, touch panels, e-paper, solar panels, and solid-state lighting, such that recovering and recycling indium has been considered quite seriously.…”
Section: Introductionmentioning
confidence: 99%