The chemical composition, semiconductor property and corrosion resistance of passive films on cold-worked 304 stainless steel containing varying amounts of martensite (0 %, 0.6 %, 6 %, 12 % and 20 %) are investigated using X-ray photoelectron spectroscopy, Mott-Schottky analyses and electrochemical impedance spectroscopy. The results indicate that after cold rolling, the microstructure in the sample transforms from single austenite into compound of martensite and original austenite. For the martensite content of 6 %, the passive film formed on the sample contains the least amount of oxide and shows the highest acceptor and donor densities; according to the inverse relationship between corrosion resistance and both acceptor and donor density, these results indicate that the passive film shows the poorest corrosion resistance among all the samples measured. When the content of martensite decrease below 6 %, the acceptor and donor densities for the passive film increase with increasing martensite content; however, for samples with the martensite content higher than 6 %, the acceptor and donor densities decrease with increasing martensite content. The oxide content and corrosion resistance show the opposite behavior with increasing martensite content: the monotonic decrease for martensite content lower than 6 % and gradual increase when the martensite content exceeds 6 %.