Corrigendum to “Depth profile analyses with sub 100-nm depth resolution of a metal thin film by femtosecond - laser ablation - inductively coupled plasma - time-of-flight mass spectrometry” Spectrochimica Acta Part B: Atomic Spectroscopy 149 (2018) 176–183

Determination of intensity ratios of Nd, Cs, Zr and Sr against U and burn-up in simulated nuclear fuels by LA-ICPMS

“…Spatial proling using LA-ICPMS needs optimized laser parameters such as wavelength, pulse width, beam shape and uence for precise and accurate measurements. [12][13][14][15][16][17][18][19][20][21] Past studies [12][13][14][15][16][17][18][19][20][21] indicate that LA-ICPMS systems with shorter wavelengths (UV or deep UV region) are preferred for stoichiometric ablation. Hence, 193 nm is a better choice than the other common UV wavelengths viz., 213, 248, and 266 nm (ref.…”

The LMS-GT instrument – a new perspective for quantification with the LIMS-TOF measurement technique

“…Some SIMS instruments provide excellent spatial resolution but SIMS quantitative performance suffers from severe matrix effects, and ion implantation [7][8][9] . ICP-MS has excellent sensitivities to the trace element level but can suffer from fractionation and interactions between the sample, transportation gas and the plasma [10][11][12] . GD-MS provides good sensitivity to trace elements but also suffers from gas-sample interactions and is limited to large sample sizes.…”