European Microscopy Congress 2016: Proceedings 2016
DOI: 10.1002/9783527808465.emc2016.5905
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Correlative microscopy for elemental analysis by NanoSIMS and Electron microscopy: optimization of sample preparation methods

Abstract: Electron microscopy (EM) and nano secondary ion mass spectrometry (NanoSIMS) aim to acquiring nanometric information, which also imply ultraresolution and therefore these techniques require the best preservation of samples. Analytical techniques such as X‐ray spectroscopy and NanoSIMS are able to identify, localize and quantify chemical elements both at the whole cell and at the intracellular level. These techniques can be coupled with biological structural analysis. The goal in sample preparation is to mainta… Show more

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