The process of least-squares
analysis has been applied for decades
in the field of crystallography. Here, we discuss the application
of this process to total scattering data, primarily in the combination
of least-squares Rietveld refinements and fitting of the atomic pair
distribution function (PDF). While these two approaches use the same
framework, the interpretation of results from least-squares fitting
of PDF data should be done with caution through carefully constructed
analysis approaches. We provide strategies and considerations for
applying least-squares analysis to total scattering data, combining
both crystallographic Rietveld and fitting of PDF data, given in context
with recent examples from the literature. This perspective is aimed
to be an accessible document for those new to the total scattering
approach, as well as a reflective framework for the total scattering
expert.