Correlation between local hysteresis and crystallite orientation in PZT thin films deposited on Si and MgO substrates

Piezoresponse force spectroscopy of ferroelectric-semiconductor materials

“…This approach was later used by several groups to probe crystallographic orientation and microstructure effects on switching behavior. [36][37][38][39][40][41] Recently, PFM spectroscopy has been extended to an imaging mode using an algorithm for fast ͑100-300 ms͒ hysteresis loop measurements developed by Jesse et al 42 The progress in experimental studies has stimulated a parallel development of theoretical models to relate PFM hysteresis loop parameters and materials properties. A number of such models are based on the interpretation of phenomenological characteristics of PFS hysteresis loops similar to macroscopic P-E loops, such as slope, imprint bias, coercive bias, remanent response, and work of switching, 43,44 as illustrated in Fig.…”

Local Piezoelectric Hysteresis Loops for the Study of Electrical Properties of 0.7Pb(Mg1/3Nb2/ 3)O3-0.3PbTiO3 Thin Films: Bottom Electrode Dependence and Film Thickness Effect

“…The many crystallographic orientations for crystallites will lead to many possible orientations of domains (polarization). The V c value being dependent on the orientation of the domain [8], this will lead to a large distribution of V c . On the other hand, on Pt, the films are highly (111)-oriented.…”

“…For electrical investigations, local piezoelectric hysteresis loops were produced by AFM on the nanoscale. Details of the experimental setup for recording loops have been reported elsewhere [5,8]. In this work, a conductive Pt-Ir-coated silicon tip with a spring constant of 40 N/m and resonant frequency of 320 kHz is used.…”

Microstructure and Nanoscale Piezoelectric/Ferroelectric Properties in La2Ti2O7 Thin Films Grown on (110)‐Oriented Doped Nb:SrTiO3 Substrates

“…Further experimental details about PFM imaging and piezoloops recording can be found elsewhere. [32][33][34][35][36][37][38] …”