Correlation between grain morphologies and magnetic properties of thin films

Choe, G.; Chung, Soon-Ju; Walser, R. M.

doi:10.1016/0040-6090(94)06438-5

Cited by 9 publications

(4 citation statements)

References 16 publications

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“…In the context of this review, the importance of this procedure is that it offers the possibility to coat individual magnetic grains with different materials, which may allow the controlled decoupling of magnetization switching in adjacent nanoparticles. A substantial reduction of media noise has been previously achieved in films with partial magnetic isolation of grains, 104,105 and the utilization of pre-made nanoparticles allows control and optimization of the domain size and shell thickness, as well as substantial improvement in the size distribution of the particles that comprise magnetic media. Superparamagnetic Fe 3 O 4 nanocrystals have been used 29 as a model system to demonstrate the LBL assembly of magnetic nanoparticle thin films and to investigate the effect of silica coating on the magnetic properties of such films.…”

Section: N(chmentioning

confidence: 99%

The Assembly of Coated Nanocrystals

2003

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The formation of nanostructured materials through the assembly of nanocrystals is described, focusing in particular on silica and other metal oxide coated core particles. The preparation and optical characterization of core-shell materials are reviewed, and some of the unique properties of core-shell materials are presented. Shell layers are shown to serve various functions. They may increase colloid stability, aid dispersion in various media, alter the optical and electrical properties of the core, add robustness, or provide a contiguous framework from which inverse lattices may be generated. The assembly of the particles into well-defined thin films and two-dimensional and three-dimensional crystals is discussed, and the resultant optical properties are reviewed. Approaches to increase the topological complexity are studied, and the potential for the creation of a variety of space-filling nanostructures (such as inverse lattices, opals, and photonic crystals) is illustrated.

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Section: N(chmentioning

confidence: 99%

The Assembly of Coated Nanocrystals

2003

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“…In the search for new materials for high density magnetic recording media applications, the chemically ordered nanostructured Co-based ferromagnetic alloys have recently received much interest [83,84] due to their high anisotropy constant. One of the main requirements for this application is to obtain epitaxial films with good textures, smooth surfaces and very low roughness.…”

Section: Magnetic Films For High Density Data Storagementioning

confidence: 99%

The energy dispersive x-ray reflectometry as a unique laboratory tool for investigating morphological properties of layered systems and devices

Albertini¹,

Paci²,

Generosi³

2006

J. Phys. D: Appl. Phys.

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The principles and technical aspects of the laboratory energy dispersive x-ray reflectometry technique (EDXR) are reviewed. X-ray reflectometry enables us to retrieve information on the morphological parameters (film thickness, surface and interface roughness) of thin films, layered materials and devices at the Å resolution. In the energy dispersive mode it makes use of a polychromatic beam and the energy scan is carried out by means of an energy sensitive detector, allowing us to keep the experimental geometry unchanged during data collection. The advantages offered by the technique, in particular when accurate time-resolved studies are to be performed, are outlined. An overview of the most significant works in the field is also reported, in order to present the wide range of its possible applications. The paper was written taking into account the necessity to provide a comprehensive description of this unusual laboratory technique. The first part of the manuscript is, therefore, devoted to the general aspects of EDXR: theoretical bases, experimental characteristics, advantages and drawbacks in comparison with alternative techniques, instrumental effects that may occur and information that can be gained by its application. In the second part of the paper, we resume the main literature results obtained by applying it to a variety of systems, to show examples of the possibilities it offers. Among the experiments reported, in particular much emphasis is given to the time-resolved in situ ones (for example, devices upon working and systems undergoing morphological modifications), which probably represents the most original use of this method.

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“…Chromium thin films are routinely used for a number of applications, in integrated circuits, photomasks, and optical beam splitters and as underlayers in multilayered magnetic media for high-density magnetorecording . The Cr film, in the last case, acts as a structural template for inducing the epitaxial growth of the magnetic Co-based film. , A crucial step to improving the magnetic and recording characteristics of multilayer media is the understanding of the inter-relationship between the deposition processes and the resulting microstructural properties of the film. In hard disk fabrication sputtering deposition is the most commonly used technique.…”

Section: Introductionmentioning

confidence: 99%

“…1 The Cr film, in the last case, acts as a structural template for inducing the epitaxial growth of the magnetic Co-based film. 2,3 A crucial step to improving the magnetic and recording characteristics of multilayer media is the understanding of the inter-relationship between the deposition processes and the resulting microstructural properties of the film. In hard disk fabrication sputtering 4 deposition is the most commonly used technique.…”

Section: Introductionmentioning

confidence: 99%

Structural and Morphological Characterization by Energy Dispersive X-ray Diffractometry and Reflectometry Measurements of Cr/Pt Bilayer Films

et al. 2003

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The characteristics of Cr thin films, currently used as resistors, as capacitor plates, and in magnetic recording hard disks, strongly depend on the deposition modality. Nevertheless, up to date no systematic study of the influence of the deposition conditions and of the substrate used on the films structural and morphological properties has been carried out.In the present work, the energy dispersive X-ray diffraction and reflectometry (EDXD and EDXR) techniques were used to investigate double-layer Cr/Pt thin films, deposited by pulsed laser deposition (PLD) at different temperatures (from RT to 600 °C) both on crystalline (Si and MgO) and on amorphous (SiO 2 ) substrates. The synergy of the two X-ray techniques allows correlating the structural properties of the samples (obtained by the EDXD) to their morphological characteristics (provided by EDXR). The result is that when the PLD deposition is performed under suitable working conditions and with use of crystalline substrates, films with good texture and with very smooth surfaces were obtained, as required by the magnetorecording applications. Moreover, the structural quality appears to be independent of the deposition temperature. Finally, the advantages connected with the joint use of the energy-dispersive X-ray diffraction and reflectometry are shortly discussed.

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Correlation between grain morphologies and magnetic properties of thin films

Cited by 9 publications

References 16 publications

The Assembly of Coated Nanocrystals

The Assembly of Coated Nanocrystals

The energy dispersive x-ray reflectometry as a unique laboratory tool for investigating morphological properties of layered systems and devices

Structural and Morphological Characterization by Energy Dispersive X-ray Diffractometry and Reflectometry Measurements of Cr/Pt Bilayer Films

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