2007
DOI: 10.1063/1.2715113
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Correlation between electron and negative O− ion emission during reactive sputtering of oxides

Abstract: The energy distribution of negative O− ions has been measured during the reactive magnetron sputtering of 13 different target materials by the means of energy resolved mass spectrometry. For the same series of target materials the ion-induced secondary electron emission coefficient was determined in an earlier published research. A correlation between this ion-induced secondary electron emission coefficient and the emission of the high energetic negative O− ions was observed. This correlation should be taken i… Show more

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Cited by 65 publications
(39 citation statements)
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References 17 publications
(20 reference statements)
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“…The detrimental effect of such energetic oxygen ions on the electrical properties of ZnO was shown by Tominaga already two decades ago [10,33]. Recently, the energy distribution functions of negative oxygen ions were measured during reactive magnetron sputtering from different metal targets, proving the high energy of these ions convincingly [34,35]. The highest energies correspond to the difference between substrate and target potential, i.e.…”
Section: Resultsmentioning
confidence: 93%
“…The detrimental effect of such energetic oxygen ions on the electrical properties of ZnO was shown by Tominaga already two decades ago [10,33]. Recently, the energy distribution functions of negative oxygen ions were measured during reactive magnetron sputtering from different metal targets, proving the high energy of these ions convincingly [34,35]. The highest energies correspond to the difference between substrate and target potential, i.e.…”
Section: Resultsmentioning
confidence: 93%
“…The same is true for ions which are neutralized and reflected at the target, and for negative ions formed at the target [46]. Collisions will alter particle energy, direction, and momentum, and therefore also the morphology and microstructure of the growing film (see next section).…”
Section: Sputtered Particlesmentioning
confidence: 94%
“…For example, thin-film growth of oxides often yields energetic negative oxygen ions [134,135,136,137,138,139,140,141,142,143].…”
Section: 31)mentioning
confidence: 99%